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2010, 59(9): 6394-6398.
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Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing. Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity. Acta Physica Sinica,
2007, 56(4): 2422-2427.
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2004, 53(2): 651-655.
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1989, 38(11): 1845-1848.
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1987, 36(3): 408-410.
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GE CHUAN-ZHENG, JIANG SHU-SHENG, MING NAI-BEN, FENG DUAN. A STUDY OF INCLUSIONS AND DISLOCATIONS IN LiNbO3 CRYSTALS BY X-RAY TOPOGRAPHY. Acta Physica Sinica,
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1981, 30(8): 1106-1110.
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