[1] |
Zhang Tian-Fu, Si Yang-Yang, Li Yi-Jie, Chen Zu-Huang. Research status and prospect of lead zirconate-based antiferroelectric films. Acta Physica Sinica,
2023, 72(9): 097704.
doi: 10.7498/aps.72.20230389
|
[2] |
Zhu Mao-Cong, Shao Ya-Jie, Zhou Jing, Chen Wen, Wang Zhi-Qing, Tian Jing. Resistive properties of CuInS2 quantum dots regulated by niobium-doped lead zirconate titanate ferroelectric films. Acta Physica Sinica,
2022, 71(20): 207301.
doi: 10.7498/aps.71.20220911
|
[3] |
Zhou Ming-Jin, Hou Qing, Pan Rong-Jian, Wu Lu, Fu Bao-Qin. Molecular dynamics study of special quasirandom structure of Zr-Nb alloys. Acta Physica Sinica,
2021, 70(3): 033103.
doi: 10.7498/aps.70.20201407
|
[4] |
Wang Zhi-Qing, Yao Xiao-Ping, Shen Jie, Zhou Jing, Chen Wen, Wu Zhi. Micromechanism of ferroelectric fatigue and enhancement of fatigue resistance of lead zirconate titanate thin films. Acta Physica Sinica,
2021, 70(14): 146302.
doi: 10.7498/aps.70.20202196
|
[5] |
Liu Hong-Li, Huang Ya-Li, Luo Chun-Hai, Hu Hai-Bo. Modeling information diffusion on microblog networks based on users' behaviors. Acta Physica Sinica,
2016, 65(15): 158901.
doi: 10.7498/aps.65.158901
|
[6] |
Gao Ya-Na, Li Xi-Feng, Zhang Jian-Hua. Solution-processed high performance HIZO thin film transistor with AZO gate dielectric. Acta Physica Sinica,
2014, 63(11): 118502.
doi: 10.7498/aps.63.118502
|
[7] |
Hu Yong-Gang, Xia Feng, Xiao Jian-Zhong, Lei Chao, Li Xiang-Dong. Microstructure evolution model of zirconia solid electrolyte based on AC impedance model analysis. Acta Physica Sinica,
2012, 61(9): 098102.
doi: 10.7498/aps.61.098102
|
[8] |
Shen Wei-Wei, Li Ping-Ping, Ke Jian-Hong. Kinetics of diffusion-limited aggregation-annihilation processes on small-world networks. Acta Physica Sinica,
2010, 59(9): 6681-6688.
doi: 10.7498/aps.59.6681
|
[9] |
Xia Zhi-Lin, Shao Jian-Da, Fan Zheng-Xiu. Effect of bulk inclusion in films on damage probability. Acta Physica Sinica,
2007, 56(1): 400-406.
doi: 10.7498/aps.56.400
|
[10] |
Hao Xiao-Peng, Wang Bao-Yi, Yu Run-Sheng, Wei Long. Zirconium-ion implantation of zircaloy-4 investiged by slow positron beam. Acta Physica Sinica,
2007, 56(11): 6543-6546.
doi: 10.7498/aps.56.6543
|
[11] |
Hou Hai-Hong, Sun Xi-Lian, Shen Yan-Ming, Shao Jian-Da, Fan Zheng-Xiu, Yi Kui. Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporation. Acta Physica Sinica,
2006, 55(6): 3124-3127.
doi: 10.7498/aps.55.3124
|
[12] |
Shen Jian, Liu Shou-Hua, Shen Zi-Cai, Kong Wei-Jin, Huang Jian-Bing, Shao Jian-Da, Fan Zheng-Xiu. Theoretical study of influence of substrate microdefects on optical properties of dielectric thin films. Acta Physica Sinica,
2005, 54(10): 4920-4925.
doi: 10.7498/aps.54.4920
|
[13] |
Tang Jun, Yang Xian-Qing, Qiu Kang. Studies on dynamical behavior in reaction limited aggregation model. Acta Physica Sinica,
2005, 54(7): 3307-3311.
doi: 10.7498/aps.54.3307
|
[14] |
Hu Xiao-Jun, Li Rong-Bin, Shen He-Sheng, He Xian-Chang, Deng Wen, Luo Li-Xiong. Investigation of defect properties in doped diamond films. Acta Physica Sinica,
2004, 53(6): 2014-2018.
doi: 10.7498/aps.53.2014
|
[15] |
Men Xiang-Jian, Cheng Jian-Gong, Li Biao, Tang Jun, Ye Hong-Juan, Guo Shao-Ling, Zhu Jun-Hao. . Acta Physica Sinica,
2000, 49(4): 811-814.
doi: 10.7498/aps.49.811
|
[16] |
XU QI-MING. A MODEL OF TEMPERATURE AND DEGREE OF CONVER-SION PROFILE FOR SELF-PROPAGATION COMBUSTION SYNTHESIS AND THEORETICAL TEMPERATURE PROFILE OF ZrB2. Acta Physica Sinica,
1999, 48(1): 16-22.
doi: 10.7498/aps.48.16
|
[17] |
GUOXIN. A GRAIN-BOUNDARY CONDUCTION MODEL FOR STABILIZED-ZIRCONIA. Acta Physica Sinica,
1998, 47(8): 1332-1338.
doi: 10.7498/aps.47.1332
|
[18] |
Hou Bi-Hui, Lu Xiao-Pu, Shi Chao-Shu, Yang Bing-Xin. . Acta Physica Sinica,
1995, 44(8): 1296-1301.
doi: 10.7498/aps.44.1296
|
[19] |
ZHANG PEI-XIAN, YAO JIE, PENG SHAO-QI. THE COMPENSATION OF DEFECTS AND DOPING IN LPCVD a-Si FILMS. Acta Physica Sinica,
1987, 36(12): 1538-1544.
doi: 10.7498/aps.36.1538
|
[20] |
MAI ZHEN-HONG, CUI SHU-FAN, FU QUAN-GUI, LIN RU-GAN, ZHANG JIN-FU. OBSERVATION ON “AS GROWN” MICRODEFECTS IN CZ SILICON SINGLE CRYSTAL. Acta Physica Sinica,
1983, 32(5): 685-688.
doi: 10.7498/aps.32.685
|