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Vasiliy Pelenovich, Zeng Xiao-Mei, Luo Jin-Bao, Rakhim Rakhimov, Zuo Wen-Bin, Zhang Xiang-Yu, Tian Can-Xin, Zou Chang-Wei, Fu De-Jun, Yang Bing. Double-step gas cluster ion beam smoothing. Acta Physica Sinica,
2021, 70(5): 053601.
doi: 10.7498/aps.70.20201454
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Zhang Ran, Chang Qing, Li Hua. Molecular dynamics simulations on scattering of Ar molecules on smooth and rough surfaces. Acta Physica Sinica,
2018, 67(22): 223401.
doi: 10.7498/aps.67.20181608
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Wang Jian-Guo, Yang Song-Lin, Ye Yong-Hong. Effect of silver film roughness on imaging property of BaTiO3 microsphere. Acta Physica Sinica,
2018, 67(21): 214209.
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Li Hai-Tao, Jiang Ya-Xiao, Tu Li-Min, Li Shao-Hua, Pan Ling, Li Wen-Biao, Yang Shi-E, Chen Yong-Sheng. Influence of annealing temperature on properties of Cu2O thin films deposited by electron beam evaporation. Acta Physica Sinica,
2018, 67(5): 053301.
doi: 10.7498/aps.67.20172463
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Cheng Guang-Gui, Zhang Zhong-Qiang, Ding Jian-Ning, Yuan Ning-Yi, Xu Duo. Wetting behaviors of the molten silicon on graphite surface. Acta Physica Sinica,
2017, 66(3): 036801.
doi: 10.7498/aps.66.036801
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Song Yan-Song, Yang Jian-Feng, Li Fu, Ma Xiao-Long, Wang Hong. Method of controlling optical surface roughness based on stray light requirements. Acta Physica Sinica,
2017, 66(19): 194201.
doi: 10.7498/aps.66.194201
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Song Yong-Feng, Li Xiong-Bing, Shi Yi-Wei, Ni Pei-Jun. Effects of surface roughness on diffuse ultrasonic backscatter in the solids. Acta Physica Sinica,
2016, 65(21): 214301.
doi: 10.7498/aps.65.214301
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Wang Yu-Xiang, Chen Shuo. Drops on microstructured surfaces: A numerical study using many-body dissipative particle dynamics. Acta Physica Sinica,
2015, 64(5): 054701.
doi: 10.7498/aps.64.054701
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Chen Su-Ting, Hu Hai-Feng, Zhang Chuang. Surface roughness modeling based on laser speckle imaging. Acta Physica Sinica,
2015, 64(23): 234203.
doi: 10.7498/aps.64.234203
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Liu Hua-Song, Ji Yi-Qin, Jiang Yu-Gang, Wang Li-Shuan, Leng Jian, Sun Peng, Zhuang Ke-Wen. Study on internal short-range order microstructure characteristic of SiO2 thin film. Acta Physica Sinica,
2013, 62(18): 187801.
doi: 10.7498/aps.62.187801
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Ke Chuan, Zhao Cheng-Li, Gou Fu-Jun, Zhao Yong. Molecular dynamics study of interaction between the H atoms and Si surface. Acta Physica Sinica,
2013, 62(16): 165203.
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Cao Hong, Huang Yong, Chen Su-Fen, Zhang Zhan-Wen, Wei Jian-Jun. Influence of pulse tapping technology on surface roughness of polyimide capsule. Acta Physica Sinica,
2013, 62(19): 196801.
doi: 10.7498/aps.62.196801
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Ma Hai-Min, Hong Liang, Yin Yi, Xu Jian, Ye Hui. Preparation and property of super-hydrophilic SiO2-TiO2 nano-particle layer. Acta Physica Sinica,
2011, 60(9): 098105.
doi: 10.7498/aps.60.098105
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Luo Yin-Yan, Zhu Xian-Fang. Effects of thermal evaporation and electron beam evaporation on two-dimensional patterned Ag nanostructure during nanosphere lithography. Acta Physica Sinica,
2011, 60(8): 086104.
doi: 10.7498/aps.60.086104
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Ding Yan-Li, Zhu Zhi-Li, Gu Jin-Hua, Shi Xin-Wei, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao. Effect of deposition rate on the scaling behavior of microcrystalline silicon films prepared by very high frequency-plasma enhanced chemical vapor deposition. Acta Physica Sinica,
2010, 59(2): 1190-1195.
doi: 10.7498/aps.59.1190
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Gu Jin-Hua, Ding Yan-Li, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao. A spectroscopic ellipsometry study of the abnormal scaling behavior of high-rate-deposited microcrystalline silicon films by VHF-PECVD technique. Acta Physica Sinica,
2009, 58(6): 4123-4127.
doi: 10.7498/aps.58.4123
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Liu Liang, Ma Xiao-Bai, Nie Rui-Juan, Yao Dan, Wang Fu-Ren. Properties of MgB2 films fabricated under different conditions by ex-situ annealing of Mg/B multilayer precursor. Acta Physica Sinica,
2009, 58(11): 7966-7971.
doi: 10.7498/aps.58.7966
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Huang Li-Qing, Pan Hua-Qiang, Wang Jun, Tong Hui-Min, Zhu Ke, Ren Guan-Xu, Wang Yong-Chang. Spontaneous formation of ordered Sn nanodot array on porous anodic alumina membrane. Acta Physica Sinica,
2007, 56(11): 6712-6716.
doi: 10.7498/aps.56.6712
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Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing. Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity. Acta Physica Sinica,
2007, 56(4): 2422-2427.
doi: 10.7498/aps.56.2422
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Yan Zhi-Jun, Wang Yin-Yue, Xu Run, Jiang Zui-Min. Structural characteristics of HfO2 films grown by e-beam evaporation. Acta Physica Sinica,
2004, 53(8): 2771-2774.
doi: 10.7498/aps.53.2771
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