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FTIR study an VO2 defect in fast neutron irradiated Czochralski silicon

Yang Shuai Li Yang-Xian Ma Qiao-Yun Xu Xue-Wen Niu Ping-Juan Li Yong-Zhang Niu Sheng-Li Li Hong-Tao

Citation:

FTIR study an VO2 defect in fast neutron irradiated Czochralski silicon

Yang Shuai, Li Yang-Xian, Ma Qiao-Yun, Xu Xue-Wen, Niu Ping-Juan, Li Yong-Zhang, Niu Sheng-Li, Li Hong-Tao
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  • Abstract views:  7912
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Publishing process
  • Received Date:  18 October 2004
  • Published Online:  10 May 2005

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