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Al2O3-Y2O3-ZrO2 ternary composite ceramics are synthesized via the traditional solid state reaction method and sintered at 14001500 ℃. The phase structure, the microstructure and the electrical properties of these samples are characterized by X-ray diffraction (XRD), scanning electron microscope (SEM) and dielectric spectra. There are not any other impurity phases in this ternary system supported by XRD patterns, and additions of Y2O3 and ZrO2 into Al2O3 make contributions to the lower calcining heat. SEM indicates that the grain sizes of these samples are about 200500 nm. Furthermore, the densities are improved and the grain boundaries are clearer for the samples sintered at higher temperatures. Relaxation peaks are observed in the dielectric loss plots and the relaxation is of non-Debye type according to Cole-Cole complex impedance spectrum.
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Keywords:
- Al2O3-Y2O3-ZrO2 ternary ceramics /
- dielectric relaxation /
- impedance spectroscopy /
- thermal conductivity
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[1] Tian M B, Liang T X 1995 Semicond. Inform. 32 7 (in Chinese) [田民波、梁彤翔 1995 半导体情报 32 7]
[2] [3] Lee J H, Yoshikawa A, Fukuda T, Waku Y 2001 J. Cryst. Growth 231 115
[4] [5] Song K X, Wu S Y, Chen X M 2007 Mater. Lett. 61 3357
[6] [7] Calderon-Moreno J M, Yoshimura M 2004 Mater. Sci. Eng. A 375-377 1246
[8] [9] Larrea A, Fuente G F, Merino R I, Orera V M 2002 J. Eur. Ceram. Soc. 22 191
[10] Pea J I, Larsson M, Merino R I, Francisco I, Orera V M, Lorce J L, Pastor J Y, Martn A, Segurado J 2006 J. Eur. Ceram. Soc. 26 3113
[11] [12] Oelgardt C, Anderson J, Heinrich J G, Messing G L 2010 J. Eur. Ceram. Soc. 30 649
[13] [14] Araki S, Yoshimura M 2006 J. Eur. Ceram. Soc. 26 3295
[15] [16] [17] Jin L L, Zhou G H, Shimai S Z, Zhang J, Wang S W 2010 J. Eur. Ceram. Soc. 30 2139
[18] [19] Kume S, Yasuoka M, Omura N, Watari K 2007 Ceram. Int. 33 269
[20] Wang C, Peng C Q, Wang R C, Yu K, Li C 2007 Chin. J. Nonferr. Met. 17 1229 (in Chinese) [王 超、彭超群、王日初、余 琨、李 超 2007 中国有色金属学报 17 1229]
[21] [22] Rossi G, Burke J E 1973 J. Am. Ceram. Soc. 56 654
[23] [24] [25] Sato E, Carry C 1996 J. Am. Ceram. Soc. 79 2156
[26] [27] Lou B Z 2008 Shandong Ceram. 31 6 (in Chinese) [娄本浊 2008 山东陶瓷 31 6]
[28] Hench L L, West J K 1990 Principles of Electronic Ceramics (New York: John Wiley Sons) p189
[29] [30] [31] Josyulu O S, Sobhanadri J 1980 Phys. Stat. Sol. A 59 323
[32] Iwauchi K 1971 Jpn. J. Appl. Phys. 10 1520
[33] [34] Verma A, Thakur O P, Prakash C, Goel T C, Mendiratta R G 2005 Mater. Sci. Eng. B 116 1
[35] [36] Ferrarelli M C, Sinclair D C, West A R, Dabkowska H A, Luke G M 2009 J. Mater. Chem. 19 5916
[37] [38] Sarkar S, Jana P K, Chaudhuri B K 2008 Appl. Phys. Lett. 92 022905
[39] [40] Zhang Z J, Xu F M, Tan Y 2009 Mater. Rev. 23 56 (in Chinese) [张志军、许富民、谭 毅 2009 材料导报 23 56]
[41] [42] [43] Costescu R M, Cahill D G, Fabreguette F H, Sechrist Z A, George S M 2004 Science 303 989
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