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Spectroscopic ellipsometry study of the Ag2O film deposited by radio-frequency reactive magnetron sputtering

Ma Jiao-Min Liang Yan Gao Xiao-Yong Chen Chao Zhao Meng-Ke Lu Jing-Xiao

Citation:

Spectroscopic ellipsometry study of the Ag2O film deposited by radio-frequency reactive magnetron sputtering

Ma Jiao-Min, Liang Yan, Gao Xiao-Yong, Chen Chao, Zhao Meng-Ke, Lu Jing-Xiao
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  • Abstract views:  5839
  • PDF Downloads:  799
  • Cited By: 0
Publishing process
  • Received Date:  16 June 2011
  • Accepted Date:  16 July 2011
  • Published Online:  05 March 2012

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