-
[1] Montgomery D S, Nobile A, Walsh P J 2004 Rev. Sci. Instrum. 75 3986
[2] Davydov D A, Kholopova O V, Kolbasov B N 2007 J. Nucl. Mater. 367 1079
[3] Swift D C, Tierney T E, Luo S N 2005 Phys. Plasmas 12 056308
[4] Kádas K, Vitos L, Johansson B 2007 Phys. Rev. B 75 035132
[5] Di Y X, Ji X H, Hu M, Qin Y W, Chen J L 2006 Acta Phys. Sin. 43 5451 (in Chinese) [邸玉贤, 计欣华, 胡明, 秦玉文, 陈金龙 2006物理学报 43 5451]
[6] Xu K W, Gao R S, Yu L G, He J W 1994 Acta Phys. Sin. 43 1295 (in Chinese) [徐可为, 高润生, 于莉根, 何家文 1994物理学报 43 1295]
[7] Freund L B, Suresh S 2007 Thin Film Materials: Stress, Defect, Formation, and Surface Evolution (Beijing: Science Press) pp145, 264 (in Chinese) [Freund L B, Suresh S 2007薄膜材料–-应力、缺陷的形成和表面演化 (北京: 科学出版社)第145, 264页]
[8] Doerner M F, Nix W D 1988 CRC Crit. Rev. Solid. State. Mater. Sci. 14 225
[9] Kong D J, Zhang Y K, Chen Z G, Lu J Z, Feng A X, Ren X D, Ge T 2007 Acta Phys. Sin. 56 4056 (in Chinese) [孔德军, 张永康, 陈志刚, 鲁金忠, 冯爱新, 任旭东, 葛涛 2007物理学报 56 4056]
[10] Conchon F, Renault P O, Bourhis E L, Krauss C, Goudeau P, Barthel E, Grachev S Y, Soudergard E, Rondeau V, Gy R, Lazzari R, Jupille J, Brun N 2010 Thin Solid Film 519 1563
[11] Birkholz M 2006 Thin Film Analysis by X-ray Scattering (Weinheim: WILEY-VCH Verlag GmbH & Co.KgaA) pp253, 276
[12] Peng J, Ji V, Seiler W, Tomescu A, Levesque A, Bouteville A 2006 Surf. Coat. Technol. 200 2738
[13] Ma C H, Huang J H, Chen H 2002 Thin Solid Film 418 73
[14] Bruker 2009 Diffrac Leptos 7 User Manual (Karlsruhe: Bruker AXS Gmbh) pp66-77
[15] Sun B, Kang C Y, Li R P, Liu Z L, Tang J, Xu P S, Pan G Q 2009 Nuclear Techniq. 32 492 (in Chinese) [孙柏, 康朝阳, 李锐鹏, 刘忠良, 唐军, 徐彭寿, 潘国强 2009 核技术 32 492]
[16] Dong P, Chen Y Z, Bai C M 2004 Rare Metal Materials and Engineering 33 445 (in Chinese) [董平, 陈勇忠, 柏朝茂 2004 稀有金属材料与工程 33 445]
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[1] Montgomery D S, Nobile A, Walsh P J 2004 Rev. Sci. Instrum. 75 3986
[2] Davydov D A, Kholopova O V, Kolbasov B N 2007 J. Nucl. Mater. 367 1079
[3] Swift D C, Tierney T E, Luo S N 2005 Phys. Plasmas 12 056308
[4] Kádas K, Vitos L, Johansson B 2007 Phys. Rev. B 75 035132
[5] Di Y X, Ji X H, Hu M, Qin Y W, Chen J L 2006 Acta Phys. Sin. 43 5451 (in Chinese) [邸玉贤, 计欣华, 胡明, 秦玉文, 陈金龙 2006物理学报 43 5451]
[6] Xu K W, Gao R S, Yu L G, He J W 1994 Acta Phys. Sin. 43 1295 (in Chinese) [徐可为, 高润生, 于莉根, 何家文 1994物理学报 43 1295]
[7] Freund L B, Suresh S 2007 Thin Film Materials: Stress, Defect, Formation, and Surface Evolution (Beijing: Science Press) pp145, 264 (in Chinese) [Freund L B, Suresh S 2007薄膜材料–-应力、缺陷的形成和表面演化 (北京: 科学出版社)第145, 264页]
[8] Doerner M F, Nix W D 1988 CRC Crit. Rev. Solid. State. Mater. Sci. 14 225
[9] Kong D J, Zhang Y K, Chen Z G, Lu J Z, Feng A X, Ren X D, Ge T 2007 Acta Phys. Sin. 56 4056 (in Chinese) [孔德军, 张永康, 陈志刚, 鲁金忠, 冯爱新, 任旭东, 葛涛 2007物理学报 56 4056]
[10] Conchon F, Renault P O, Bourhis E L, Krauss C, Goudeau P, Barthel E, Grachev S Y, Soudergard E, Rondeau V, Gy R, Lazzari R, Jupille J, Brun N 2010 Thin Solid Film 519 1563
[11] Birkholz M 2006 Thin Film Analysis by X-ray Scattering (Weinheim: WILEY-VCH Verlag GmbH & Co.KgaA) pp253, 276
[12] Peng J, Ji V, Seiler W, Tomescu A, Levesque A, Bouteville A 2006 Surf. Coat. Technol. 200 2738
[13] Ma C H, Huang J H, Chen H 2002 Thin Solid Film 418 73
[14] Bruker 2009 Diffrac Leptos 7 User Manual (Karlsruhe: Bruker AXS Gmbh) pp66-77
[15] Sun B, Kang C Y, Li R P, Liu Z L, Tang J, Xu P S, Pan G Q 2009 Nuclear Techniq. 32 492 (in Chinese) [孙柏, 康朝阳, 李锐鹏, 刘忠良, 唐军, 徐彭寿, 潘国强 2009 核技术 32 492]
[16] Dong P, Chen Y Z, Bai C M 2004 Rare Metal Materials and Engineering 33 445 (in Chinese) [董平, 陈勇忠, 柏朝茂 2004 稀有金属材料与工程 33 445]
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