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制备了四种不同孔隙率的Pb0.99(Zr0.95Ti0.05)0.98Nb0.02O3铁电陶瓷,并研究了冲击波作用下孔隙率对陶瓷去极化性能的影响. 研究表明: 短路负载条件下陶瓷的放电波形不随孔隙的加入而改变,均为方波. 多孔陶瓷的放电脉冲幅度较低,脉冲宽度较长. 释放的电荷量随着孔隙率的增加而减小,与静态电滞回线测试结果一致. 多孔陶瓷具有较低的冲击阻抗,改善了与封装介质的阻抗匹配. 用Lysne模型拟合了材料在高电阻负载条件下的放电行为,并指出高电阻负载条件下材料的介电常数是静态介电常数的4—5倍,而且材料的介电常数随孔隙率的增加而减小. 冲击波通过样品以后,电路的放电时间常数随着孔隙率的增大而增大. 随着电阻的增大,样品负载电压增高,材料铁电-反铁电相变受到抑制,电流上升沿变缓,致密陶瓷出现了击穿现象.
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关键词:
- Pb0.99(Zr0.95Ti0.05)0.98Nb0.02O3铁电陶瓷 /
- 孔隙率 /
- 冲击波 /
- 去极化
Four kinds of Pb0.99(Zr0.95Ti0.05)0.98Nb0.02O3 ferroelectric ceramics with different porosities are prepared, and the porosity effects on the depoling characteristics of those samples under shock wave load are investigated. The results show that under short circuit condition, the releasing current waveforms are in the form of square pulse for all samples. The amplitude of the current pulse decreases, but the width increases with the porosity increasing. The releasing charge decreases with the porosity increasing, which is consistent with the measurement by P-E loop. Porous ceramics has lower shock impedance, which improves the impedance match to the encapsulation medium. The depoling characteristics of those samples under high resistance load are simulated well by Lysne model. The results reveal that the dielectric constant of the sample is 4—5 times larger than that under static state, moreover, it decreases with porosity increasing. After the shock wave passing through the sample, the discharging time constant increases with porosity increasing. As the load increases, the rising edge becomes less steep for the restrain of the ferroelectric phase-antiferroelectric phase transformation under high electric field, and the breakdown happens to the dense ceramics.-
Keywords:
- Pb0.99(Zr0.95Ti0.05)0.98Nb0.02O3 ferroelectric ceramics /
- porosity /
- shock wave /
- depoling
[1] Dungan R H, Barnett H M, Stark A H 1962 J. Am. Ceram. Soc. 45 382
[2] Neilson F W 1957 Bull. Am. Phys. Soc. 2 302
[3] Tretyakov D V 2005 Instrum. Exp. Tech. 48 726
[4] Wang Y L, Yuan W Z, He G R, Lin S W, Ling R H, Qu C F 1983 Acta Phys. Sin. 32 780 (in Chinese) [王永龄、 袁万宗、 何国荣、 林盛卫、 凌荣华、 瞿翠凤1983 物理学报 32 780]
[5] Doran D G 1968 J. Appl. Phys. 39 40
[6] Furnish M D, Chhabildas L C, Setchell R E, Montgomery S T 2000 AIP Conf. Proc. 505 975
[7] Lysne P C 1976 J. Appl. Phys. 48 1020
[8] Lysne P C 1977 J. Appl. Phys. 49 4565
[9] Setchell R E 2005 J. Appl. Phys. 97 013507
[10] Setchell R E 2007 J. Appl. Phys. 101 053525
[11] Zeng T, Dong X L, Mao C L, Liang R H, Yang H 2006 Acta Phys. Sin. 55 3073 (in Chinese) [曾 涛、 董显林、 毛朝梁、 梁瑞虹、 杨 洪 2006 物理学报 55 3073] 〖12] Zeng T, Dong X L, Mao C L, Zhou Z Y, Yang H 2007 J. Eur. Ceram. Soc. 27 2025
[12] Yin Z W 2003 Dielectric Physics (Beijing: Science Press) p755 (in Chinese) [殷之文 2003电介质物理学 (北京: 科学出版社) 第755页]
[13] Lysne P C 1974 J. Appl. Phys. 46 231
[14] Banno H 1987 Am. Ceram. Soc. Bull. 66 1332
[15] Jiang D D, Du J M, Gu Y, Feng Y J 2008 Acta Phys. Sin. 57 565 (in Chinese)[蒋冬冬、 杜金梅、 谷 岩、 冯玉军 2008 物理学报 57 565]
[16] Takch Y, Shkuratov S I, Talantsev E F, Dickens J C, Kristinansen M, Altgilbers L L 2002 IEEE Trans. Plasma Sci. 30 1665
[17] Zavattieri P D, Espinosa H D 2001 Acta Mater. 49 4291
[18] Setchell R E 2003 J. Appl. Phys. 94 573
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[1] Dungan R H, Barnett H M, Stark A H 1962 J. Am. Ceram. Soc. 45 382
[2] Neilson F W 1957 Bull. Am. Phys. Soc. 2 302
[3] Tretyakov D V 2005 Instrum. Exp. Tech. 48 726
[4] Wang Y L, Yuan W Z, He G R, Lin S W, Ling R H, Qu C F 1983 Acta Phys. Sin. 32 780 (in Chinese) [王永龄、 袁万宗、 何国荣、 林盛卫、 凌荣华、 瞿翠凤1983 物理学报 32 780]
[5] Doran D G 1968 J. Appl. Phys. 39 40
[6] Furnish M D, Chhabildas L C, Setchell R E, Montgomery S T 2000 AIP Conf. Proc. 505 975
[7] Lysne P C 1976 J. Appl. Phys. 48 1020
[8] Lysne P C 1977 J. Appl. Phys. 49 4565
[9] Setchell R E 2005 J. Appl. Phys. 97 013507
[10] Setchell R E 2007 J. Appl. Phys. 101 053525
[11] Zeng T, Dong X L, Mao C L, Liang R H, Yang H 2006 Acta Phys. Sin. 55 3073 (in Chinese) [曾 涛、 董显林、 毛朝梁、 梁瑞虹、 杨 洪 2006 物理学报 55 3073] 〖12] Zeng T, Dong X L, Mao C L, Zhou Z Y, Yang H 2007 J. Eur. Ceram. Soc. 27 2025
[12] Yin Z W 2003 Dielectric Physics (Beijing: Science Press) p755 (in Chinese) [殷之文 2003电介质物理学 (北京: 科学出版社) 第755页]
[13] Lysne P C 1974 J. Appl. Phys. 46 231
[14] Banno H 1987 Am. Ceram. Soc. Bull. 66 1332
[15] Jiang D D, Du J M, Gu Y, Feng Y J 2008 Acta Phys. Sin. 57 565 (in Chinese)[蒋冬冬、 杜金梅、 谷 岩、 冯玉军 2008 物理学报 57 565]
[16] Takch Y, Shkuratov S I, Talantsev E F, Dickens J C, Kristinansen M, Altgilbers L L 2002 IEEE Trans. Plasma Sci. 30 1665
[17] Zavattieri P D, Espinosa H D 2001 Acta Mater. 49 4291
[18] Setchell R E 2003 J. Appl. Phys. 94 573
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