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After accounting for a contact resistance between carbon nanotube (CNT) and substrate, the local electric filed of top of CNT were calculated by combining an improved floated sphere model and the Fowler-Nordheim theory for understand the effect of the contact resistance on field emission from CNT. It is found that the field emission current is limited and current saturation and nonlinear characteristics of the Fowler-Nordheim plots are produced by the contact resistance in region of high electric field. The origin can be attributed to the local electric filed of top of CNT remarkably debases as compared to without the contact resistance.
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Keywords:
- Carbon nanotube /
- field emission /
- contact resistance /
- current saturation
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[7] Fowler R H, Nordheim D L 1928 Proc. Roy. Soc. London, Ser. A 119 173
[8] Zhang J H, Wang X, Yang W W, Yu W D, Feng T, Li Q, Liu X H 2006 Carbon 44 418
[9] Chen L F, Song H, Zhao H F, Liu X, Guo W G, Li D B, Jiang H, Cao L Z, Li Z M 2009 J. Appl. Phys. 106 033703
[10] Yamashita T, Hasegawa S, Nishida S, Ishimaru M, Hirotsu Y, Asahi H 2005 Appl. Phys. Lett. 44 082109
[11] Wang X Q,Wang M, He P M, Xu Y B, Li Z H 2004 J. Appl. Phys. 96 6752
[12] Wang X Q, Wang M, Li Z H, Yang B, Wang F F, He P M, Xu Y B 2005 Acta Phys. Sin. 54 1347 (in Chinese) [王新庆,王淼,李振华,杨兵,王凤飞,何丕模,徐亚伯 2005 物理学报 54 1347]
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[14] She J C , Xu N S, Deng S Z, Chen J, Bishop H, Huq S E, Wang L, Zhong D Y, Wang E G 2003 Appl. Phys. Lett. 83 2671
[15] Xu X P, Brandes G R 1999 Appl. Phys. Lett. 74 2549
[16] Dean K A, Chalamala B R 2000 Appl. Phys. Lett. 76 375
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[1] Bethune D, Kiang C-H, de Vries M, Gorman G, Savoy R, Vazquez J, Beyers R 1993 Nature 363 605
[2] de Heer W A, Chatelain A, Ugarte D 1995 Science 270 1179
[3] Zhong D Y, Zhang G Y, Liu S, Sakurai T, Wang E G 2002 Appl. Phys. Lett. 80 506
[4] Choi W B, Chung D S, Kang J H 1999 Appl. Phys. Lett. 75 312
[5] Zhang J, Yang G, Cheng Y, Gao B, Qiu Q, Cheng Y, Gao B, Qiu Q, Lu J P , Zhou O 2003 Appl. Phys. Lett. 86 184104
[6] Park J H, Son G H, Moon J S, Han J H, Berdinsky A S, Kuvshinov D G, Yoo J B, Park C Y, Nam J W, Park J, Lee C G, Choe D H 2005 J. Vac. Sci. Technol. B 23 749
[7] Fowler R H, Nordheim D L 1928 Proc. Roy. Soc. London, Ser. A 119 173
[8] Zhang J H, Wang X, Yang W W, Yu W D, Feng T, Li Q, Liu X H 2006 Carbon 44 418
[9] Chen L F, Song H, Zhao H F, Liu X, Guo W G, Li D B, Jiang H, Cao L Z, Li Z M 2009 J. Appl. Phys. 106 033703
[10] Yamashita T, Hasegawa S, Nishida S, Ishimaru M, Hirotsu Y, Asahi H 2005 Appl. Phys. Lett. 44 082109
[11] Wang X Q,Wang M, He P M, Xu Y B, Li Z H 2004 J. Appl. Phys. 96 6752
[12] Wang X Q, Wang M, Li Z H, Yang B, Wang F F, He P M, Xu Y B 2005 Acta Phys. Sin. 54 1347 (in Chinese) [王新庆,王淼,李振华,杨兵,王凤飞,何丕模,徐亚伯 2005 物理学报 54 1347]
[13] Wang M, Shang X F, Li Z H, Wang X Q, Xu Y B 2006 Acta Phys. Sin. 55 797 (in Chinese) [王淼,尚学府,李振华,王新 庆,徐亚伯 2005 物理学报 54 797]
[14] She J C , Xu N S, Deng S Z, Chen J, Bishop H, Huq S E, Wang L, Zhong D Y, Wang E G 2003 Appl. Phys. Lett. 83 2671
[15] Xu X P, Brandes G R 1999 Appl. Phys. Lett. 74 2549
[16] Dean K A, Chalamala B R 2000 Appl. Phys. Lett. 76 375
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