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研究了子晶格干涉畴尺寸不同情况下的X射线衍射问题,给出了衍射峰积分宽度与子晶格干涉畴尺寸的关系表达式,证明出子晶格干涉畴尺寸不同不影响X射线衍射各峰的相对积分强度,提供了一种结构缺陷的分析方法。An expression of relation of X-ray diffraction integrated width and the different coherent domain sizes associated with sublattices is obtained. We conclude that the structural defect has no influence on the X-ray diffraction integrated intensity. A method for studying defect is suggested.
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