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Ultrasonic detection of white etching defect based on convolution neural network

Zhu Qi Xu Duo Zhang Yuan-Jun Li Yu-Juan Wang Wen Zhang Hai-Yan

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Ultrasonic detection of white etching defect based on convolution neural network

Zhu Qi, Xu Duo, Zhang Yuan-Jun, Li Yu-Juan, Wang Wen, Zhang Hai-Yan
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  • Abstract views:  3858
  • PDF Downloads:  85
  • Cited By: 0
Publishing process
  • Received Date:  25 July 2022
  • Accepted Date:  23 August 2022
  • Available Online:  07 December 2022
  • Published Online:  24 December 2022

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