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稀掺杂GaNxAs1-x(x≤0.03)薄膜的调制光谱研究

王 茺 陈平平 刘昭麟 李天信 夏长生 陈效双 陆 卫

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稀掺杂GaNxAs1-x(x≤0.03)薄膜的调制光谱研究

王 茺, 陈平平, 刘昭麟, 李天信, 夏长生, 陈效双, 陆 卫

Study of the modulated spectra of dilute GaNxAs1-x (x≤0.03) thin films

Wang Chong, Chen Ping-Ping, Liu Zhao-Lin, Li Tian-Xin, Xia Chang-Sheng, Chen Xiao-Shuang, Lu Wei
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  • 利用室温下压电调制反射光(PzR)谱技术系统测量了N掺杂浓度为0.0%—3%的分子束外延生长GaNxAs1-x薄膜,并对图谱中所观察的光学跃迁进行了指认.在GaN0.005As0.995和GaN0.01As0.99薄膜的PzR谱中观察到此前只在椭圆偏振谱中才看到的N掺杂相关能态E1+Δ1+ΔN.当N掺杂浓度达到
    Dilute GaNxAs1-x thin films with N concentration from 0.0% to 3% have been grown by molecular beam epitaxy. Piezomodulated reflectance (PzR) spectra of these thin films have been measured at room temperature, and optical transitions in PzR spectra have been well resolved. The N-related transition of E1+Δ1+ΔN had been observed in PzR spectrum of GaN0.005As0.995 and GaN0.01As0.99 films. The well resolved split between heavy hole and light hole of Γ valence band is shown in PzR when the N doping level is up to 1%. The N concentration dependence of transition energies supports the model that both E+ and E* originate from the L conductive band at room temperature.
    • 基金项目: 国家重点基础研究发展规划项目(批准号:2004CB619004),上海光科技基金(批准号:046105013)及上海浦江人才计划(批准号:05PJ4103)资助的课题.
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  • 文章访问数:  6659
  • PDF下载量:  1000
  • 被引次数: 0
出版历程
  • 收稿日期:  2005-12-12
  • 修回日期:  2006-01-23
  • 刊出日期:  2006-07-20

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