温度梯度场对电声脉冲法空间电荷测量波形的影响

陈曦; 王霞; 吴锴; 彭宗仁; 成永红

doi:10.7498/aps.59.7327

摘要

电力设备运行中的温升现象严重影响绝缘的使用寿命,因此高温下的空间电荷测量引起了许多学者的关注.但温度升高时,聚合物材料的声阻抗、Young模量、密度、声波在其中传播的速度、衰减特性均发生变化,因此无法准确测量出介质中的空间电荷特性.而对于温度梯度场下的绝缘介质(如电缆发热场)的空间电荷测量,温度的梯度分布对介质的声阻抗、弹性模量、密度、声速及声波衰减的影响将更为复杂.本文基于电声脉冲测量方法中声波的传播特性和温度对聚乙烯材料特性的影响,分析了温度梯度场对空间电荷测量结果的影响并进行了波形恢复.

关键词:

温度梯度 /
聚乙烯 /
空间电荷 /
校正

Abstract

Temperature rise of power equipment in service serionsly affect the lifetime of insulation, so many researchers have focused on space charge measurements at high temperature. But the changes of polymeric properties (e.g. sound impedance, Young’s modulus, density, velocity of sound wave, decay characteristic etc.) at high temperature make measurement of space charge profiles in polymer inaccurate. What is more, the changes of polymeric properties are more complex under temperature gradient. In this paper, based on the propagation characteristic of sound wave in pulsed electroacoustic method and temperature dependence of polyethylene properties, the effect of temperature gradient on space charge measurement is analyzed and the space charge waveform is recovered.

Keywords:

作者及机构信息

1.
西安交通大学,电力设备电气绝缘国家重点实验室,西安 710049

基金项目: 国家自然科学基金(批准号:50907050)和高等学校科技创新工程重大项目培育基金(批准号:707053) 资助的课题.

Authors and contacts

1.
State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China

参考文献

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[2]	An Z L, Yang Q, Zheng F H, Zhang Y W 2007 Acta Phys. Sin. 56 5502 (in Chinese) [安振连、杨强、郑飞虎、张冶文 2007物理学报 56 5502]
[3]	Chong Y L, Chen G, Miyake H, Matsui K, Tanaka Y, Takada T 2006 J. Phys. D: Appl. Phys. 39 1658
[4]	Liu F D, Yang B T, Tu D M, Liu Y N 1992 Acta Phys. Sin. 41 333 (in Chinese) [刘付德、杨百屯、屠德民、刘耀南 1992 物理学报 41 333]
[5]	Yang Q, An Z L, Zheng F H, Zhang Y W 2009 Acta Phys. Sin. 58 8529 (in Chinese) [杨强、安振连、郑飞虎、张冶文 2009 物理学报 58 8529]
[6]	Fukunage K 2004 IEEE Electr. Insul. Mag. 20 18
[7]	Zheng F H, Zhang Y W, Wu C S, Li J X, Xia Z F 2003 Acta Phys. Sin. 52 1137 (in Chinese) [郑飞虎、张冶文、吴长顺、李吉晓、夏钟福 2003物理学报 52 1137]
[8]	Maeno T 1999 Trans. IEE Jpn. 119- A 1114
[9]	Wu C Y, Zhong L S, Wang X, Tu D M 2005 Proc. CSEE 25 137 (in Chinese) [吴超一、钟力生、王霞、屠德民 2005 中国电机工程学报 25 137]
[10]	Fabiani D, Montanari G C, Laurent C, Teyssedre G, Morshuis F H F, Bodega R, Dissado L A 2008 IEEE Electr. Insul. Mag. 24 5
[11]	Fu M, Dissado L A, Chen G, Fothergill J C 2008 IEEE Trans. Dielectr. Electr. Insul. 10 851
[12]	Bambery K R, Fleming R J 1997 J. Therm. Anal. 50 19
[13]	Zhang C, Kaneko K, Mizutani T 2001 Appl. Phys. Lett. 79 3839
[14]	Nishimura H, Inoue F, Nakashiba A 1994 Polym. Engng. Sci. 34 1529
[15]	Akio N, Hiroyuki N, Fumio I, Tomokazu N, Katsuhiko H, Hideo N 1993 Polym. Engng. Sci. 33 1146
[16]	Fan T B, Zhang D, Zhang Z, Ma Y, Gong X F 2008 Chin. Phys. B 17 3372

施引文献

[1]	Yang Q, An Z L, Zheng F H, Zhang Y W 2008 Acta Phys. Sin. 57 3834 (in Chinese) [杨强、安振连、郑飞虎、张冶文 2008 物理学报 57 3834]
[2]	An Z L, Yang Q, Zheng F H, Zhang Y W 2007 Acta Phys. Sin. 56 5502 (in Chinese) [安振连、杨强、郑飞虎、张冶文 2007物理学报 56 5502]
[3]	Chong Y L, Chen G, Miyake H, Matsui K, Tanaka Y, Takada T 2006 J. Phys. D: Appl. Phys. 39 1658
[4]	Liu F D, Yang B T, Tu D M, Liu Y N 1992 Acta Phys. Sin. 41 333 (in Chinese) [刘付德、杨百屯、屠德民、刘耀南 1992 物理学报 41 333]
[5]	Yang Q, An Z L, Zheng F H, Zhang Y W 2009 Acta Phys. Sin. 58 8529 (in Chinese) [杨强、安振连、郑飞虎、张冶文 2009 物理学报 58 8529]
[6]	Fukunage K 2004 IEEE Electr. Insul. Mag. 20 18
[7]	Zheng F H, Zhang Y W, Wu C S, Li J X, Xia Z F 2003 Acta Phys. Sin. 52 1137 (in Chinese) [郑飞虎、张冶文、吴长顺、李吉晓、夏钟福 2003物理学报 52 1137]
[8]	Maeno T 1999 Trans. IEE Jpn. 119- A 1114
[9]	Wu C Y, Zhong L S, Wang X, Tu D M 2005 Proc. CSEE 25 137 (in Chinese) [吴超一、钟力生、王霞、屠德民 2005 中国电机工程学报 25 137]
[10]	Fabiani D, Montanari G C, Laurent C, Teyssedre G, Morshuis F H F, Bodega R, Dissado L A 2008 IEEE Electr. Insul. Mag. 24 5
[11]	Fu M, Dissado L A, Chen G, Fothergill J C 2008 IEEE Trans. Dielectr. Electr. Insul. 10 851
[12]	Bambery K R, Fleming R J 1997 J. Therm. Anal. 50 19
[13]	Zhang C, Kaneko K, Mizutani T 2001 Appl. Phys. Lett. 79 3839
[14]	Nishimura H, Inoue F, Nakashiba A 1994 Polym. Engng. Sci. 34 1529
[15]	Akio N, Hiroyuki N, Fumio I, Tomokazu N, Katsuhiko H, Hideo N 1993 Polym. Engng. Sci. 33 1146
[16]	Fan T B, Zhang D, Zhang Z, Ma Y, Gong X F 2008 Chin. Phys. B 17 3372

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