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本文提出了层状结构铁电陶瓷经热压后材料择优取向度的定义和X射线测定方法。只需测定任一或数条(00l)衍射线加压前后衍射强度比值,即可求出取向度。用含铋层优化合物pbBi4Ti4O15作为测定实例,证明了这一方法的适用性。The definition and an X-ray determination method of the degee of preferred orientation of ferroelectric ceramics with layer type structure after hot-pressing procedure are presented. The degree of preferred orientation can be obtained by merely determining the ratio of diffraction intensity of any one or more (00l) lines before and after hot-pressing procedure. Taking the mixed bismuth oxide compound with layer type structure PbBi4Ti4O15 as an example the suitability of this method has been proved.
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