[1] |
Zhong Xiao-Yan, Li Zhuo. Atomic scale characterization of three-dimensional structure, magnetic properties and dynamic evolutions of materials by transmission electron microscopy. Acta Physica Sinica,
2021, 70(6): 066801.
doi: 10.7498/aps.70.20202072
|
[2] |
Lü Hao-Chang, Zhao Yun-Chi, Yang Guang, Dong Bo-Wen, Qi Jie, Zhang Jing-Yan, Zhu Zhao-Zhao, Sun Yang, Yu Guang-Hua, Jiang Yong, Wei Hong-Xiang, Wang Jing, Lu Jun, Wang Zhi-Hong, Cai Jian-Wang, Shen Bao-Gen, Yang Feng, Zhang Shen-Jin, Wang Shou-Guo. High resolution imaging based on photo-emission electron microscopy excited by deep ultraviolet laser. Acta Physica Sinica,
2020, 69(9): 096801.
doi: 10.7498/aps.69.20200083
|
[3] |
Li Chao, Yao Yuan, Yang Yang, Shen Xi, Gao Bin, Huo Zong-Liang, Kang Jin-Feng, Liu Ming, Yu Ri-Cheng. In situ transmission electron microscopy studies on nanomaterials and HfO2-based storage nanodevices. Acta Physica Sinica,
2018, 67(12): 126802.
doi: 10.7498/aps.67.20180731
|
[4] |
Li Dong-Dong, Zhou Wu. Low voltage scanning transmission electron microscopy for two-dimensional materials. Acta Physica Sinica,
2017, 66(21): 217303.
doi: 10.7498/aps.66.217303
|
[5] |
Wang Jiang-Jing, Shao Rui-Wen, Deng Qing-Song, Zheng Kun. Study on electrical transport properties of strained Si nanowires by in situ transmission electron microscope. Acta Physica Sinica,
2014, 63(11): 117303.
doi: 10.7498/aps.63.117303
|
[6] |
Wen Cai, Li Fang-Hua, Zou Jin, Chen Hong. High-resolution electron microscopy of misfit dislocations in AlSb/GaAs(001) system. Acta Physica Sinica,
2010, 59(3): 1928-1937.
doi: 10.7498/aps.59.1928
|
[7] |
Wan Wei, Tang Chun-Yan, Wang Yu-Mei, Li Fang-Hua. A study on the stacking fault in GaN crystals by high-resolution electron microscope imaging. Acta Physica Sinica,
2005, 54(9): 4273-4278.
doi: 10.7498/aps.54.4273
|
[8] |
Guo Hai-Ming, Liu Hong-Wen, Wang Ye-Liang, Xie Hui-Min, Dai Fu-Long, Gao Hong-Jun. Moiré fringes of HOPG and mica in scanning probe microscopy. Acta Physica Sinica,
2003, 52(10): 2514-2519.
doi: 10.7498/aps.52.2514
|
[9] |
WANG ZHEN-XIA, HU JUN, WANG WEN-MIN, YU GUO-QING, RUAN MEI-LING. A HIGH RESOLUTION ELECTRON MICROSCOPY INVESTIGATION OF CURVATURE IN MULTILAYER GRAPHITE SHEETS. Acta Physica Sinica,
1998, 47(11): 1853-1857.
doi: 10.7498/aps.47.1853
|
[10] |
GAO YI-HUA, ZHANG ZE, YAN MING-LANG, LAI WU-YAN. HREM STUDY OF THE INTERFACIAL STRUCTURE OF NiFe/Mo MAGNETIC MULTILAYERS. Acta Physica Sinica,
1998, 47(5): 765-777.
doi: 10.7498/aps.47.765
|
[11] |
XU HUI-FANG, LUO GU-FENG, HU MEI-SHENG, CHEN JUN. HRTEM STUDY OF THE SUPERLATTICE ORTHOCLASE. Acta Physica Sinica,
1989, 38(9): 1527-1529.
doi: 10.7498/aps.38.1527
|
[12] |
WANG YUAN-MING, CHEN JIANG-HUA, HU TIAN-BAO. A NEW DEVELOPMENT IN THE REAL SPACE HIGH RESOLU-TION ELECTRON MICROSCOPE SIMULATION METHOD. Acta Physica Sinica,
1989, 38(9): 1521-1526.
doi: 10.7498/aps.38.1521
|
[13] |
ZHAO JIAN-GUO, LI FANG-HUA, CHEN WEI, XIE SI-SHEN, CAO NING, ZHENG JIA-QI. HIGH RESOLUTION ELECTRON MICROSCOPY STUDY ON HIGH Tc SUPERCONDUCTOR Nd-Ba-Cu-O. Acta Physica Sinica,
1989, 38(3): 508-510.
doi: 10.7498/aps.38.508
|
[14] |
WANG YUAN-MING, QU HUA. QUASI REAL SPACE (QRS) IMAGE SIMULATION IN HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica,
1986, 35(11): 1480-1487.
doi: 10.7498/aps.35.1480
|
[15] |
KONG QING-PING, WANG XIANG, ZHOU HAO, NI QUN-HUI. ELECTRON MICROSCOPY STUDIES ON THE INTERACTION BETWEEN CREEP AND FATIGUE. Acta Physica Sinica,
1986, 35(8): 1091-1094.
doi: 10.7498/aps.35.1091
|
[16] |
WEN SHU-LIN, FENG JING-WEI. LATTICE DEFECTS IN α-Si3N4 STUDIED BY HREM. Acta Physica Sinica,
1985, 34(7): 951-955.
doi: 10.7498/aps.34.951
|
[17] |
FENG GUO-GUANG, YANG CUI-YING, ZHOU YU-QING, TANG DI-SHENG. STRUCTURAL ANALYSIS OF Li2O·14Nb2O5 BY COMBINED CONVERGENT-BEAM ELECTRON DIFFRACTION AND HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica,
1984, 33(11): 1581-1585.
doi: 10.7498/aps.33.1581
|
[18] |
KANG ZHEN-CHUAN. THE DIRECT DETERMINATION OF STACKING FAULTS SEQUENCE IN ZnS POLYTYPE BY HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica,
1982, 31(5): 664-667.
doi: 10.7498/aps.31.664
|
[19] |
LI FANG-HUA, FAN HAI-FU. IMAGE DECONVOLUTION IN HIGH RESOLUTION ELECTRON MICROSCOPY BY MAKING USE OF SAYRE'S EQUATION. Acta Physica Sinica,
1979, 28(2): 276-278.
doi: 10.7498/aps.28.276
|
[20] |
Li Fang-hua. DETERMINATION OF CRYSTAL STRUCTURES BY HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica,
1977, 26(3): 193-198.
doi: 10.7498/aps.26.193
|