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STUDY ON HIGH-FIELD ELECTRON TRAPPING AND DETRAPPING PROPERTY IN THIN SiOx Ny FILMS

YANG BING-LIANG LIU BAI-YONG Y. C. CHENG H. WONG

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STUDY ON HIGH-FIELD ELECTRON TRAPPING AND DETRAPPING PROPERTY IN THIN SiOx Ny FILMS

YANG BING-LIANG, LIU BAI-YONG, Y. C. CHENG, H. WONG
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(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

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  • Abstract views:  6918
  • PDF Downloads:  622
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Publishing process
  • Received Date:  13 December 1990
  • Published Online:  28 June 2005

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