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Dong Zheng-Qiong, Zhao Hang, Zhu Jin-Long, Shi Ya-Ting. Influence of incident illumination on optical scattering measurement of typical photoresist nanostructure. Acta Physica Sinica,
2020, 69(3): 030601.
doi: 10.7498/aps.69.20191525
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Wang Pan-Pan, Zhang Yu-Zhi, Peng Ming-Dong, Zhang Yun-Long, Wu Ling-Nan, Cao Yun-Zhen, Song Li-Xin. Spectroscopic ellipsometry analysis of vanadium oxide film in Vis-NIR and NIR-MIR. Acta Physica Sinica,
2016, 65(12): 127201.
doi: 10.7498/aps.65.127201
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Li Jiang, Tang Jing-You, Pei Wang, Wei Xian-Hua, Huang Feng. Accurate determination of thickness values and optical constants of absorbing thin films on opaque substrates with spectroscopic ellipsometry. Acta Physica Sinica,
2015, 64(11): 110702.
doi: 10.7498/aps.64.110702
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Yang Wei, Liang Ji-Ran, Liu Jian, Ji Yang. Abnormal variation of optical properties of vanadium oxide thin film at semiconductor-metal transition. Acta Physica Sinica,
2014, 63(10): 107104.
doi: 10.7498/aps.63.107104
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Yu Tian-Yan, Qin Yang, Liu Ding-Quan. Investigation of the crystal and optical properties of ZnS thin films deposited at different temperature. Acta Physica Sinica,
2013, 62(21): 214211.
doi: 10.7498/aps.62.214211
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Huang Zhuo-Yin, Li Guo-Long, Li Kan, Zhen Hong-Yu, Shen Wei-Dong, Liu Xiang-Dong, Liu Xu. Determination of optical constants and thickness of photoactive layer in polymer oslar cells by single transmission measurement. Acta Physica Sinica,
2012, 61(4): 048801.
doi: 10.7498/aps.61.048801
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Dai Yu, Zhang Jian-Xun. Stereoscopic visualization based on splitting of two-way polarized image beams. Acta Physica Sinica,
2011, 60(8): 084205.
doi: 10.7498/aps.60.084205
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Li Guo-Long, Huang Zhuo-Yin, Li Kan, Zhen Hong-Yu, Shen Wei-Dong, Liu Xu. Analysis of the effect of active layer thickness on polymer solar cell performance based on optical and opto-electronic model. Acta Physica Sinica,
2011, 60(7): 077207.
doi: 10.7498/aps.60.077207
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Liao Guo-Jin, Luo Hong, Yan Shao-Feng, Dai Xiao-Chun, Chen Ming. Determination of the optical constants of the magnetron sputtered aluminum oxide films from the transmission spectra. Acta Physica Sinica,
2011, 60(3): 034201.
doi: 10.7498/aps.60.034201
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Zhou Yi, Wu Guo-Song, Dai Wei, Li Hong-Bo, Wang Ai-Ying. Accurate determination of optical constants and thickness of absorbing thin films by a combined ellipsometry and spectrophotometry approach. Acta Physica Sinica,
2010, 59(4): 2356-2363.
doi: 10.7498/aps.59.2356
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Zhao Hua-Jun, Yang Shou-Liang, Zhang Dong, Liang Kang-You, Cheng Zheng-Fu, Shi Dong-Ping. Design of polarizing beam splitters based on subwavelength metal grating. Acta Physica Sinica,
2009, 58(9): 6236-6242.
doi: 10.7498/aps.58.6236
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Wang Xiao-Dong, Shen Jun, Wang Sheng-Zhao, Zhang Zhi-Hua. Optical constants of sol-gel derived TiO2 films characterized by spectroscopic ellipsometry. Acta Physica Sinica,
2009, 58(11): 8027-8032.
doi: 10.7498/aps.58.8027
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Xue Chun-Rong, Yi Kui, Qi Hong-Ji, Shao Jian-Da, Fan Zheng-Xiu. Optical constants of fluoride films in the DUV range. Acta Physica Sinica,
2009, 58(7): 5035-5040.
doi: 10.7498/aps.58.5035
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Liang Li-Ping, Hao Jian-Ying, Qin Mei, Zheng Jian-Jun. Determination of the optical constants of sol-gel derived ZrO2 films simply form the transmission spectra. Acta Physica Sinica,
2008, 57(12): 7906-7911.
doi: 10.7498/aps.57.7906
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Zhang Shuan-Qin, Shi Yun-Long, Huang Chang-Geng, Lian Chang-Chun. Design of spectral reflective properties of the stealth coating. Acta Physica Sinica,
2007, 56(9): 5508-5512.
doi: 10.7498/aps.56.5508
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Su Wei_Tao, Li Bin, Liu Ding_Quan, Zhang Feng_Shan. The relation between crystal structure and infrared optical properties of ErF3 film. Acta Physica Sinica,
2007, 56(5): 2541-2546.
doi: 10.7498/aps.56.2541
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Huang Li-Qing, Pan Hua-Qiang, Wang Jun, Tong Hui-Min, Zhu Ke, Ren Guan-Xu, Wang Yong-Chang. Spontaneous formation of ordered Sn nanodot array on porous anodic alumina membrane. Acta Physica Sinica,
2007, 56(11): 6712-6716.
doi: 10.7498/aps.56.6712
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Sun Cheng-Wei, Liu Zhi-Wen, Qin Fu-Wen, Zhang Qing-Yu, Liu Kun, Wu Shi-Fa. Influences of growth temperature on the crystalline characteristics and optical properties for ZnO films deposited by reactive magnetron sputtering. Acta Physica Sinica,
2006, 55(3): 1390-1397.
doi: 10.7498/aps.55.1390
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Su Qing-Feng, Liu Jian-Min, Wang Lin-Jun, Shi Wei-Min, Xia Yi-Ben. Effects of deposition conditions on infrared spectroscopic ellipsometry of CVD diamond films. Acta Physica Sinica,
2006, 55(10): 5145-5149.
doi: 10.7498/aps.55.5145
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Wang Jian, Wang Cheng-Wei, Li Yan, Liu Wei-Min, Shigeaki Zaima. Determination of optical parameters of ordered Ag/AAO nano-array composite structure. Acta Physica Sinica,
2005, 54(12): 5920-5925.
doi: 10.7498/aps.54.5920
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