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An model of tunneling gate current for uniaxially strained Si nMOSFET

Wu Hua-Ying Zhang He-Ming Song Jian-Jun Hu Hui-Yong

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An model of tunneling gate current for uniaxially strained Si nMOSFET

Wu Hua-Ying, Zhang He-Ming, Song Jian-Jun, Hu Hui-Yong
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  • Abstract views:  8743
  • PDF Downloads:  637
  • Cited By: 0
Publishing process
  • Received Date:  12 October 2010
  • Accepted Date:  03 December 2010
  • Published Online:  15 September 2011

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