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Effects of high pressure annealing technique on the structure, morphology and electric properties of 0.65PMN-0.35PT thin films

Guo Hong-Li Yang Huan-Yin Tang Huan-Fang Hou Hai-Jun Zheng Yong-Lin Zhu Jian-Guo

Citation:

Effects of high pressure annealing technique on the structure, morphology and electric properties of 0.65PMN-0.35PT thin films

Guo Hong-Li, Yang Huan-Yin, Tang Huan-Fang, Hou Hai-Jun, Zheng Yong-Lin, Zhu Jian-Guo
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  • Abstract views:  7066
  • PDF Downloads:  888
  • Cited By: 0
Publishing process
  • Received Date:  28 January 2013
  • Accepted Date:  19 March 2013
  • Published Online:  05 July 2013

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