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Periodic structure is the basic physical model in optical film design. Universal conditions of the reflecting center wavelength are given. With the refractive index dispersion of the layers, the reflecting center wavelength and the band characteristic of equal-thickness and unequal-thickness periodic structures are studied. According to experimental results, in both the equal-thickness and unequal-thickness periodic structures with the refractive index dispersion of the coating layers, the reflecting center wavelength moves towards the longer wavelengths, and the reflective series as well as the relative wave number will depart from linear relation. For the same optical thickness of the film with unequal-thickness periodic structure, when the optical thickness of the high refractive index layer is bigger than that of the low refractive index layer, the departure from linear relation between the reflective series and the relative wave number is higher. For the low reflective series, the bandwidth of unequal-thickness periodic structure is smaller than that of equal-thickness periodic structure. The influence of the layer dispersion on the bandwidth is found to be weak.
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Keywords:
- periodic structure /
- refractive index dispersion /
- center wavelength /
- reflecting bandwidth
[1] Pervak V, Tikhonravov A V, Trubetskov M K, Pistner J, Krausz F, Apolonski A 2007 Appl. Opt. 46 1190
[2] Tikhonravov A V, Trubetskov M K, DeBell G W 2007 Appl. Opt. 46 704
[3] ALFRED THELEN 1963 JOSA 53 1266
[4] Zheng K S, GE D S 2006 Acta Phys. Sin. 55 2789 (in Chinses) [郑奎松, 葛德彪 2009 物理学报 55 2789]
[5] He Z L, Chen H G 1986 Acta Optics. Sin. 55 2789 (in Chinses) [何兆麟, 陈惠广 1986 光学学报 55 2789]
[6] Ishtvan F, Yuri P 1992 Proc. SPIE 1781 201
[7] Tang J F, Gu P F, Liu X, Li H F 2006 Modern Optical Thin Film Technology (Hang zhou, Zhe Jiang University Press) p107–118 [唐晋发, 顾培夫, 刘旭, 李海峰 2006 现代光学薄膜技术 (杭州: 浙江大学出版社) 第107–118页]
[8] Essential Macleod 2010 Optical Coating Design Program, 2010, Version 9.5, Thin Film Center Inc.
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[1] Pervak V, Tikhonravov A V, Trubetskov M K, Pistner J, Krausz F, Apolonski A 2007 Appl. Opt. 46 1190
[2] Tikhonravov A V, Trubetskov M K, DeBell G W 2007 Appl. Opt. 46 704
[3] ALFRED THELEN 1963 JOSA 53 1266
[4] Zheng K S, GE D S 2006 Acta Phys. Sin. 55 2789 (in Chinses) [郑奎松, 葛德彪 2009 物理学报 55 2789]
[5] He Z L, Chen H G 1986 Acta Optics. Sin. 55 2789 (in Chinses) [何兆麟, 陈惠广 1986 光学学报 55 2789]
[6] Ishtvan F, Yuri P 1992 Proc. SPIE 1781 201
[7] Tang J F, Gu P F, Liu X, Li H F 2006 Modern Optical Thin Film Technology (Hang zhou, Zhe Jiang University Press) p107–118 [唐晋发, 顾培夫, 刘旭, 李海峰 2006 现代光学薄膜技术 (杭州: 浙江大学出版社) 第107–118页]
[8] Essential Macleod 2010 Optical Coating Design Program, 2010, Version 9.5, Thin Film Center Inc.
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