低速Xeq+(4q20)离子与Ni表面碰撞中的光辐射

徐秋梅; 杨治虎; 郭义盼; 刘会平; 陈燕红; 赵红赟

doi:10.7498/aps.67.20172570

摘要

实验中测量了0.38VBohr（460 keV）高电荷态Xeq+（4q20）离子轰击高纯Ni表面发射的400510 nm光谱.实验结果包括Ni I原子谱线，Ni Ⅱ离子谱线，以及入射离子中性化发射的Xe I，Xe Ⅱ和Xe Ⅲ谱线.研究了谱线Xe Ⅱ 410.419，Xe Ⅲ 430.444，Xe Ⅱ 434.200，Xe Ⅱ 486.254，Ni I 498.245，Ni I 501.697，Ni I 503.502，Ni I 505.061和Ni I 508.293 nm的光子产额随着入射离子电荷态的变化.结果表明，入射离子中性化和溅射Ni原子发射谱线的光子产额随着入射离子电荷态的增加而增加，其趋势与入射离子势能一致.

关键词:

Abstract

Bombarded by slow highly charged ion (SHCI), particles including ions and atoms of metal are excited and ejected from the sample. Optical emission can be observed for the radiative de-excitation of some excited atomic particles. The important information about particle ejection and incident ion neutralization, as well as the nature, the kinetic energy, and the number of the sputtered excited particles can be obtained by studying the optical emission process. The optical emission from the the collisions between slow (V~0.38 VBohr) highly charged Xeq+ (4 q 20) ions and high purity Ni (99.995%) surface is studied. The experiment is carried out at the 320 kV for multi-discipline research with HCIs in the Institute of Modern Physics, Chinese Academy of Sciences. The spectral lines are analyzed by using an Sp-2558 spectrometer equipped with a pattern of 1200 groves/mm blazed at 500 nm and an R955 photomultiplier tube at the exit slit. The target beam current corresponding to the dwell time is recorded, which can be translated into the incident ion current. Based on the formula of Y=N/(t/Ceq), the spectral line intensity is normalized. The normalized spectrum can be obtained from the interaction of 0.38VBohr Xe20+ ions with Ni surface in a wavelength range of 400-510 nm. The species at excited state can be identified by comparing the wavelengths of spectral lines with those in the standard spectroscopic table. Most of the observed spectral lines are identified as being from the electron transitions of Ni I 3d9(2D)4p-3d9(2D5/2)4d, Ni I 3d8(3F)4s4p(3P)-3d84s(4F)5s and Ni Ⅱ 3p63d9-3p63d8(3P)4s, as well as Xe I 5p5(2P3/2)6s-5p5(2P3/2)8p, Xe Ⅱ 5p4(3P2)6p-5p4(3P2)6d and Xe Ⅲ 5s25p3(2D)6s-5s25p3(2D)6p. Compared with the single charged ion, some neutralized incident ions yield Xe I, Xe Ⅱ, Xe Ⅲ spectral lines. The photon yields of spectral lines, such as Xe Ⅱ 410.419, Xe Ⅲ 430.444, Xe Ⅱ 434.200, Xe Ⅱ 486.254, Ni I 498.245, Ni I 501.697, Ni I 503.502, Ni I 505.061 and Ni I 508.293 nm, are presented each as a function of charge state of incident ion. The results show that the photon yield increases with the increase of the charge state, which is consistent with the potential energy of the incident ion. The potential energy is the driving force for photon emission of excited Ni atom. The neutralization of Xeq+ is in good agreement with that indicated by the classical over-the-barrier model.

Keywords:

作者及机构信息

1.
中国科学院近代物理研究所, 兰州 730000;

2.
中国科学院大学, 北京 100049;

3.
南京航空航天大学航天学院, 南京 210016

通信作者: 杨治虎, z.yang@impcas.ac.cn

基金项目: 国家自然科学基金联合重点基金（批准号：U1732269）资助的课题.

Authors and contacts

1.
Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;

2.
University of Chinese Academy of Sciences, Beijing 100049, China;

3.
College of Astronautics, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China

Corresponding author: Yang Zhi-Hu, z.yang@impcas.ac.cn

Funds: Project supported by the Joint Funds of the National Natural Science Foundation of China (Grant No. U1732269).

参考文献

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[37]	Postawa Z, Rutkowski J, Poradzisz A, Czuba P, Szymonski M 1986 Nucl. Instrum. Methods B 18 574
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[42]	Takahashi S, Nagata K, Tona M, Sakurai M, Naka-mura N, Yamada C, Ohtani S 2005 Surf. Sci. 593 318
[43]	Makoto S, Kouji S, Takahiro M 2016 J. Surf. Sci. Nanotechnol. 14 1

施引文献

[1]	Schneider D H G, Briere M A 1996 Phys. Scr. 53 228
[2]	Wang G H 1988 Physics of Particle Interactions with Solids (Part 1) (Beijing:Scientific Press) pp267-346 (in Chinese)[王广厚 1988 粒子同固体相互作用物理学(上册) (北京:科学出版社) 第267346页]
[3]	Burgdorfer J, Morgenstern R, Niehaus A 1986 J. Phys.B:At. Mol. Phys. 19 L507
[4]	Burgdorfer J, Reinhold C, Hagg L, Meyer F 1996 Aust. J. Phys. 49 527
[5]	Winter H, Aumayr F 1999 J. Phys. B 32 R39
[6]	Bethe H A, Salpeter E E 1957 Encyclopedia of Physics (Handbuch der Physik) (Berlin, Heidelberg:Springer) pp334-409
[7]	Schenkel T, Barnes A V, Niedermayr T R, Hattass M, Newman M W, Machicoane G A, McDonald J W, Hamza A V, Schneider D H 1999 Phys. Rev. Lett. 83 4273
[8]	Burgdorfer J, Lerner P, Meyer F W 1991 Phys. Rev. A 44 5674
[9]	Schenkel T, Hamza A V, Barnes A V, Schneider D H 1999 Prog. Surf. Sci. 61 23
[10]	Lemell C, Winter H P, Aumayr F, Burgdorfer J, Meyer F 1996 Phys. Rev. A 53 880
[11]	Sun L T, Zhao H W, Li J Y, Wang H, Ma B H, Zhang Z M, Zhang X Z, Guo X H, Shang Y, Li X X, Feng Y C, Zhu Y H, Wang P Z, Liu H P, Song M T, Ma X W, Zhan W L 2007 Nucl. Instrum. Methods B 263 503
[12]	Zhao H, Su H, Xu Q, Guo Y, Kong J, Qian Y, Yang Z 2014 J. Phys.:Conf. Ser. 488 142012
[13]	Roger K, Kerkdijk C B 1974 Surf. Sci. 46 537
[14]	Wright R B, Gruen D M 1980 Nucl. Instrum. Methods 170 577
[15]	Delaunay M, Fehringer M, Geller R, Hitz D, Varga P, Winter H 1987 Phys. Rev. B 35 4232
[16]	Della-Negra S, Depauw J, Joret H, Le Beyec Y, Schweikert E A 1988 Phys. Rev. Lett. 60 948
[17]	Aumayr F, Kurz H, Schneider D, Briere M, Mcdonald J, Cunningham C, Winter H P 1993 Phys. Rev. Lett. 71 1943
[18]	Krsa J, Lska L, Stckli M P, Fehrenbach C W 2002 Nucl. Instrum. Methods B 196 61
[19]	Andersen N, Andersen B, Veje E 1982 Radiat. Eff. 60 119
[20]	Braun M 1979 Phys. Scr. 19 33
[21]	White C W, Tolk N H 1971 Phys. Rev. Lett. 26 486
[22]	Ryabchikova T A, Landstreet J D, Gelbmann M J, Bolgova G T, Tsymbal V V, Weiss W W 1997 Astron. Astrophys. 327 1137
[23]	Cowley C R, Mathys G 1998 Astron. Astrophys. 339 165
[24]	Cowley C R, Hubrig S 2012 Astron. Nachr. AN 333 34
[25]	Yong D, Brito A A, Costa G S D, Alonso-Garca J, Karakas A I, Pignatari M, Roederer I U, Aoki W, Fishlock C K, Grundahl F, Norris J E 2014 Mon. Not. R. Astron. Soc. 439 2638
[26]	Carraro G, Villanova S, Monaco L, Beccari G, Ahumada J A, Boffin H M J 2014 Astron. Astrophys. 562 A39
[27]	Fuhr J R, Martin G A, Wlese W L, Younger S M 1981 J. Phys. Chem. Ref. 10 305
[28]	Morishita Y, Kanai Y, Ando K, Hutton R, Brage T, Torii H A, Komaki K, Masuda H, Ishii K, Rosmej F B, Yamazaki Y 2003 Nucl. Instrum. Methods B 205 758
[29]	Lake R E, Pomeroy J M, Sosolik C E 2011 Nucl. Instrum. Methods B 269 1199
[30]	Miller M H, Roig R A, Bengtson R D 1973 Phys. Rev. A 8 480
[31]	Jimenez E, Campos J, Sanchezdel R C 1974 J. Opt. Soc. Am. 64 1009
[32]	Coetzer F J, Westhuizen P 1980 Z. Physik A 294 199
[33]	Pegg D J, Gaillard M L, Bingham C R, Carter H K, Mlekodaj R L 1982 Nucl. Instrum. Methods 202 153
[34]	Das M B, Karmakar S 2005 Eur. Phys. J. D 32 285
[35]	Suchanska M 1997 Prog. Surf. Sci. 54 165
[36]	Tribble R E, Prior M H, Stokstad R G 1990 Nucl. Instrum. Methods B 44 412
[37]	Postawa Z, Rutkowski J, Poradzisz A, Czuba P, Szymonski M 1986 Nucl. Instrum. Methods B 18 574
[38]	Assad C, Liu W, Tribble R E 1991 Nucl. Instrum. Methods B 62 201
[39]	Veje E 1983 Phys. Rev. B 28 88
[40]	Veje E 1983 Phys. Rev. B 28 5029
[41]	Veje E 1988 Z. Phys. B:Condens. Matter 70 55
[42]	Takahashi S, Nagata K, Tona M, Sakurai M, Naka-mura N, Yamada C, Ohtani S 2005 Surf. Sci. 593 318
[43]	Makoto S, Kouji S, Takahiro M 2016 J. Surf. Sci. Nanotechnol. 14 1

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