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Defect control of semiconductors is critical to the photoelectric conversion efficiency of solar cells, because the defect and doping directly determine the carrier distribution, concentration, charge transfer and non-radiative recombination of photogenerated carriers. The defect types, structures and properties are complicated in the real semiconductors, which makes experimental characterization difficult, especially for the point defects. In this review, we firstly introduce the approaches of defect calculation based on the first-principles calculations, and take a series of typical solar cell materials for example, including CdTe, Cu(In/Ga)Se2, Cu2ZnSnS(Se)4 and CH3NH3PbI3. The elucidating of computations is also conducible to understanding and controlling the defect properties of solar cell materials in practical ways. The comparative study of these solar cell materials indicates that their efficiency bottlenecks are closely related to their defect properties. Unlike the traditional four-coordination semiconductor, the unique “defect tolerance” characteristic shown in the six-coordination perovskite materials enables the battery to have a high photoelectric conversion efficiency even when it is prepared not under harsh experimental conditions. Based on the first principles, the defect calculation plays an increasingly important role in understanding the material properties of solar cells and the bottleneck of device efficiency. At present, the calculation of defects based on the first principle mainly focuses on the formation energy and transition energy levels of defects. However, there is still a lack of researches on the dynamic behavior of carriers, especially on the non-radiative recombination of carriers, which directly affects the photoelectric conversion efficiency. Recently, with the improvement of computing power and the development of algorithms, it is possible to quantitatively calculate the electron-ion interaction, then quantitatively calculate the carriers captured by defect state. These methods have been used to study the defects of solar cells, especially perovskite solar cells. In this direction, how to combine these theoretical calculation results with experimental results to provide a more in-depth understanding of experimental results and further guide experiments in improving the efficiency of solar cells is worthy of further in-depth research.
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Keywords:
- solar cell materials /
- semiconductor /
- defect /
- first-principles calculation
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图 11 CuIn1–xGaxSe2的光电转换效率和开路电压随带隙值变化趋势
Fig. 11. The photoelectric conversion efficiency and open circuit voltage of CuIn1–xGaxSe2 vs. the bandgap value[80].
图 12 CuInSe2的
$ \sum 3\left(114\right) $ 晶界 (a)超胞结构; (b)晶界处的局域原子结构; (c)晶界处的态密度、能带结构和差分电荷密度; (d)晶界处错键形成缺陷带的过程[91]Fig. 12.
$ \sum 3\left(114\right) $ of CuInSe2 grain boundary: (a) Supercell structure; (b) local atomic structures at grain boundaries; (c) state density, energy band structure and differential charge density at the grain boundary; (d) the process of forming a defect band by a wrong bond at the grain boundary[91]. -
[1] Neumark G F 1997 Mater. Sci. Eng. 21 3
[2] Zhang S, Northrup J 1991 Phys. Rev. Lett. 67 2339Google Scholar
[3] Hine N D M, Frensch K, Foulkes W M C, Finnis M W 2009 Phys. Rev. B 79 024112Google Scholar
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[10] Yin W J, Ma J, Wei S H, Aljassim M M, Yan Y 2012 Phys. Rev. B 86 045211Google Scholar
[11] Yin W J, Shi T, Yan Y 2014 Appl. Phys. Lett. 104 063903Google Scholar
[12] Yin W J, Shi T, Yan Y 2014 Adv. Mater. 26 4653Google Scholar
[13] Frost J M, Butler K T, Brivio F, Hendon C H, Schilfgaarde M V, Walsh A 2014 Nano Lett. 14 2584Google Scholar
[14] Yang D, Ming W, Shi H, Zhang L, Du M H 2016 Chem. Mater. 28 4349Google Scholar
[15] Mosconi E, Amat A, Nazeeruddin M K, Grätzel M, Angelis F D 2013 J. Mater. Chem. C 117 13902
[16] Carvalho A, Tagantsev A K, Öberg S, Briddon P R, Setter N 2010 Phys. Rev. B 81 075215Google Scholar
[17] Lindstr M A, Mirbt S, Sanyal B, Klintenberg M 2016 J. Phys. D Appl. Phys. 49 035101Google Scholar
[18] Berding M A 1999 Phys. Rev. B 60 8943Google Scholar
[19] Wei S H, Zhang S B 2002 Phys. Rev. B 66
[20] Chang Y C, James R B, Davenport J W 2006 Phys. Rev. B 73 035211Google Scholar
[21] Du M H, Takenaka H, Singh D J 2008 Phys. Rev. B 77 094122Google Scholar
[22] Du M H, Takenaka H, Singh D J 2008 J. Appl. Phys. 104 093521Google Scholar
[23] Lordi V 2013 J. Cryst. Growth 379 84Google Scholar
[24] Biswas K, Du M H 2012 New J. Phys. 14 063020Google Scholar
[25] Shepidchenko A, Sanyal B, Klintenberg M, Mirbt S 2015 Sci. Rep. 5 14509Google Scholar
[26] Emanuelsson P, Omling P, Meyer B K, Wienecke M, Schenk M 1993 Phys. Rev. B 47 15578Google Scholar
[27] Castaldini A, Cavallini A, Fraboni B, Fernandez P, Piqueras J 1998 J. Appl. Phys. 83 2121Google Scholar
[28] Szeles C, Shan Y, Lynn K G, Moodenbaugh A, Eissler E E 1997 Phys. Rev. B 55 6945Google Scholar
[29] Reislöhner U 1998 J. Cryst. Growth 184 1160
[30] Kimel A V, Pavlov V V, Pisarev R V, Gridnev V N, Rasing T 2000 Phys. Rev. B 621 R10610
[31] Yang J H, Yin W J, Park J S, Ma J, Wei S H 2016 Semicond. Sci. Tech. 31 083002Google Scholar
[32] Ma J, Kuciauskas D, Albin D, Bhattacharya R, Reese M, Barnes T, Li J V, Gessert T, Wei S H 2013 Phys. Rev. Lett. 111 067402Google Scholar
[33] Tsuchiya T 2013 Appl. Phys. Express 4 094104
[34] Reshchikov M A, Kvasov A A, Bishop M F, McMullen T, Usikov A, Soukhoveev V, Dmitriev V A 2011 Phys. Rev. B 84 075212Google Scholar
[35] Juršėnas S, Miasojedovas S, Kurilčik G, Žukauskas A, Hageman P R 2003 Appl. Phys. Lett. 83 66Google Scholar
[36] Kuciauskas D, Kanevce A, Dippo P, Seyedmohammadi S, Malik R 2015 IEEE J. Photovolt. 5 366Google Scholar
[37] Shi L, Wang L W 2012 Phys. Rev. Lett. 109 245501Google Scholar
[38] Park J H, Farrell S, Kodama R, Blissett C, Wang X, Colegrove E, Metzger W K, Gessert T A, Sivananthan S 2014 J. Electron. Mater. 43 2998Google Scholar
[39] Fahrenbruch A L 1987 Sol. Energy Mater. Sol. Cells 21 399
[40] Morehead F F, Mandel G 1964 IEEE T. Electron Dev. 5 53
[41] Heller, A 1977 J. Electrochem. Soc. 124 697Google Scholar
[42] Anthony T C, Fahrenbruch A L, Peters M G, Bube R H 1998 J. Appl. Phys. 57 400
[43] Zandian M, Chen A C, Edwall D D, Pasko J G, Arias J M 1997 Appl. Phys. Lett. 71 2815Google Scholar
[44] Hails J E, Irvine S J C, Cole-Hamilton D J, Giess J, Houlton M R, Graham A 2008 J. Electron. Mater. 37 1291Google Scholar
[45] Arias M J 1990 J. Vac. Sci. Technol. A 8 1025Google Scholar
[46] Yang J H, Shi L, Wang L W, Wei S H 2016 Sci. Rep. 6 21712Google Scholar
[47] Kraft C, Metzner H, Hädrich M, Reislöhner U, Schley P, Gobsch G, Goldhahn R 2010 Thin Solid Films 108 777
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[51] Crowder B L, Hammer W N 1966 Phys. Rev. 150 541Google Scholar
[52] Altosaar M, Kukk P E, Mellikov E 2000 Thin Solid Films 361 443
[53] Mccandless B E, Moulton L V, Birkmire R W 1997 Prog. Photovolt: Res. Appl. 5 249Google Scholar
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