| [1] |
Zhang Zhan-Gang, Yang Shao-Hua, Lin Qian, Lei Zhi-Feng, Peng Chao, He Yu-Juan. Experimental study on real-time measurement of single-event effects of 14 nm FinFET and 28 nm planar CMOS SRAMs based on Qinghai-Tibet Plateau. Acta Physica Sinica,
2023, 72(14): 146101.
doi: 10.7498/aps.72.20230161
|
| [2] |
Geng Xiao-Bin, Li Ding-Gen, Xu Bo. Mechanical stress-thermodynamic phase-field simulation of lithium dendrite growth in solid electrolyte battery. Acta Physica Sinica,
2023, 72(22): 220201.
doi: 10.7498/aps.72.20230824
|
| [3] |
Song Kai-Xin, Min Shu-Gang, Gao Jun-Qi, Zhang Shuang-Jie, Mao Zhi-Neng, Shen Ying, Chu Zhao-Qiang. Impedance characteristics of magnetoelectric antennas. Acta Physica Sinica,
2022, 71(24): 247502.
doi: 10.7498/aps.71.20220591
|
| [4] |
Feng Jie, Cui Yi-Hao, Li Yu-Dong, Wen Lin, Guo Qi. Influence mechanism and recognition algorithm of CMOS active pixel sensor radiation damage on star sensor star map recognition. Acta Physica Sinica,
2022, 71(18): 184208.
doi: 10.7498/aps.71.20220894
|
| [5] |
Liu Ni, Wang Jian-Fen, Liang Jiu-Qing. Ground-state cooling of mechanical resonator in double optical cavity. Acta Physica Sinica,
2020, 69(6): 064202.
doi: 10.7498/aps.69.20191541
|
| [6] |
Wang Bo, Li Yu-Dong, Guo Qi, Liu Chang-Ju, Wen Lin, Ma Li-Ya, Sun Jing, Wang Hai-Jiao, Cong Zhong-Chao, Ma Wu-Ying. Research on dark signal degradation in 60Co γ-ray-irradiated CMOS active pixel sensor. Acta Physica Sinica,
2014, 63(5): 056102.
doi: 10.7498/aps.63.056102
|
| [7] |
Song Wei, Chen Yu-Hao, Li Xiao-Hui, Zhang Xian-Liang, Wang Jia-Hui, Cai Zhi-Gang. Mechanical resonance based acoustic spectrographic technique. Acta Physica Sinica,
2012, 61(22): 226202.
doi: 10.7498/aps.61.226202
|
| [8] |
Liu Bi-Wei, Chen Jian-Jun, Chen Shu-Ming, Chi Ya-Qin. NPN bipolar effect and its influence on charge sharing in a tripe well CMOS technology with n+ deep well. Acta Physica Sinica,
2012, 61(9): 096102.
doi: 10.7498/aps.61.096102
|
| [9] |
Chen Hai-Feng, Guo Li-Xin. Influence of gate voltage on gate-induced drain leakage current in ultra-thin gate oxide and ultra-short channel LDD nMOSFET's. Acta Physica Sinica,
2012, 61(2): 028501.
doi: 10.7498/aps.61.028501
|
| [10] |
Liu Fan-Yu, Liu Heng-Zhu, Liu Bi-Wei, Liang Bin, Chen Jian-Jun. Effect of doping concentration in p+ deep well on charge sharing in 90nm CMOS technology. Acta Physica Sinica,
2011, 60(4): 046106.
doi: 10.7498/aps.60.046106
|
| [11] |
Sun Guang-Ai, Darren Hughes, Thilo Pirling, Vincent Ji, Chen Bo, Chen Hua, Wu Er-Dong, Zhang Jun. Neutron diffraction study of stress and lattice mismatch induced by thermo-mechanical fatigue in single crystal superalloys. Acta Physica Sinica,
2009, 58(4): 2549-2555.
doi: 10.7498/aps.58.2549
|
| [12] |
Zhu Zhang-Ming, Qian Li-Bo, Yang Yin-Tang. A novel interconnect crosstalk RLC analytic model based on the nanometer CMOS technology. Acta Physica Sinica,
2009, 58(4): 2631-2636.
doi: 10.7498/aps.58.2631
|
| [13] |
Yu Yi-Ting, Yuan Wei-Zheng, Qiao Da-Yong, Liang Qing. A novel microstructure for in-situ measurement of residual stress in micromechanical thin films. Acta Physica Sinica,
2007, 56(10): 5691-5697.
doi: 10.7498/aps.56.5691
|
| [14] |
Chen Hai-Feng, Hao Yue, Ma Xiao-Hua, Tang Yu, Meng Zhi-Qin, Cao Yan-Rong, Zhou Peng-Ju. Characteristics of degradation under GIDL stress in ultrathin gate oxide LDD nMOSFET’s. Acta Physica Sinica,
2007, 56(3): 1662-1667.
doi: 10.7498/aps.56.1662
|
| [15] |
Zhao Yi, Wan Xing-Gong. Substrate and process dependence of gate oxide reliability of 0.18μm dual gate CMOS process. Acta Physica Sinica,
2006, 55(6): 3003-3006.
doi: 10.7498/aps.55.3003
|
| [16] |
He Bao-Ping, Chen Wei, Wang Gui-Zhen. A comparison of ionizing radiation damage in CMOS devices from 60Co Gamma rays, electrons and protons. Acta Physica Sinica,
2006, 55(7): 3546-3551.
doi: 10.7498/aps.55.3546
|
| [17] |
Zhang Chao-Hui, Luo Jian-Bin, Wen Shi-Zhu. Effects of nano-scale particles in chemical mechanical polishing process. Acta Physica Sinica,
2005, 54(5): 2123-2127.
doi: 10.7498/aps.54.2123
|
| [18] |
Yang Kang-Sheng, Wu Guo-Tao, Zhang Xiao-Bin, Chen Xiao-Hua, Lu You-Nan, Wang Miao, Wang Chun-Sheng, He Pi-Mu, Xu Zhu-De, Li Wen-Zhu. . Acta Physica Sinica,
2000, 49(3): 522-526.
doi: 10.7498/aps.49.522
|
| [19] |
MIAO WEI-FANG, LI GU-SONG, LI SHU-LING, WANG JING-TANG. THE ROLE OF INTERNAL STRESS IN THE AMORPHIZATION PROCESS DURING MECHANICAL ALLOYING. Acta Physica Sinica,
1992, 41(6): 924-928.
doi: 10.7498/aps.41.924
|
| [20] |
LIN LAN-YING, SHU HUNG-DAR. THE MECHANICAL DAMAGE OF INDIUM ANTIMONIDE. Acta Physica Sinica,
1964, 20(12): 1268-1277.
doi: 10.7498/aps.20.1268
|
下载:
