Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

Investigation on surface damage phenomena induced by flashover across semiconductor

Zhao Wen-Bin Zhang Guan-Jun Yan Zhang

Citation:

Investigation on surface damage phenomena induced by flashover across semiconductor

Zhao Wen-Bin, Zhang Guan-Jun, Yan Zhang
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

Metrics
  • Abstract views:  9121
  • PDF Downloads:  857
  • Cited By: 0
Publishing process
  • Received Date:  11 September 2007
  • Accepted Date:  06 March 2008
  • Published Online:  05 April 2008

/

返回文章
返回