Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

Characteristics of high- and low-dose-rate damage for domestic npn transistors of various emitter areas

Zheng Yu-Zhan Lu Wu Ren Di-Yuan Wang Yi-Yuan Guo Qi Yu Xue-Feng He Cheng-Fa

Citation:

Characteristics of high- and low-dose-rate damage for domestic npn transistors of various emitter areas

Zheng Yu-Zhan, Lu Wu, Ren Di-Yuan, Wang Yi-Yuan, Guo Qi, Yu Xue-Feng, He Cheng-Fa
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

Metrics
  • Abstract views:  7717
  • PDF Downloads:  1028
  • Cited By: 0
Publishing process
  • Received Date:  18 November 2008
  • Accepted Date:  08 January 2009
  • Published Online:  05 April 2009

/

返回文章
返回