-
Perpendicularly magnetized MnAlx thin films with different Al contents have been epitaxied on GaAs (001) substrates by a molecular-beam epitaxy system. Crystalline quality of MnAlx films is closely related to Al content, and magnetic properties of MnAlx films are improved as crystalline quality of MnAlx fims increases. MnAl0.9 film shows the best crystalline quality and magnetic property among all samples. So we grew MnAl0.9 films at different growth temperatures to further optimize growth conditions. With increasing temperature, the chemical order parameter increases and the full width at half maximum of the τ(002) peak decreases, which reveal the improvement of crystalline quality. Higher perpendicular magnetization, coercivity and magnetic anisotropy are found as growth temperature increases. The best crystalline quality and perpendicularly magnetized properties are found at 350℃; the coercivity of 8.3 kOe, saturation magnetization of 265 emu/cm3, Mr/Ms of 0.933 and perpendicular magnetic anisotropy constant of 7.74 Merg/cm3 are achieved. These tunable perpendicularly magnetized properties and good compatibility associated with semiconductor materials make the noble-metal-free and rare-earth-free MnAl films attractive in the application of spintronic devices.
[1] Zhu Y, Cai J W 2005 Acta Phys. Sin. 54 393 (in Chinese) [竺云, 蔡建旺 2005 物理学报 54 393]
[2] Feng C, Li B H, Teng J, Yang T, Yu G H 2005 Acta Phys. Sin. 54 4898 (in Chinese) [冯春, 李宝河, 滕蛟, 杨涛, 于广华 2005 物理学报 54 4898]
[3] Wang H, Yang F J, Xue S X, Cao X, Wang J A, Gu H S, Zhao Z Q 2005 Acta Phys. Sin. 54 1415 (in Chinese) [王浩, 杨辅军, 薛双喜, 曹歆, 王君安, 顾豪爽, 赵子强 2005 物理学报 54 1415]
[4] Weller D, Moser A, Folks L, Best M E, Lee W, Toney M F, Schwickert M, Thiele J U, Doerner M F 2001 IEEE Trans. on Magn. 36 10
[5] Zhang X H 2010 Master. Dissertation (Shanghai: Fudan University) (in Chinese) [张旭辉 2010 硕士学位论文 (上海: 复旦大学)]
[6] Gerhardt N C, Hovel S, Brenner C, Hofmann M R, Lo F Y, Reuter D, Wieck A D, Schuster E, Keune W, Westerholt K 2005 Appl. Phys. Lett. 87 032502
[7] Tehrani S, Slaughter J M, Chen E, Durlam M, Shi J, DeHerrera M 1999 IEEE Trans. Magn. 35 2814
[8] Koch A J J, Hokkeling P, Steeg M G, Vos K J 1960 J. Appl. Phys. 31 75S
[9] Sakuma A 1994 J. Phys. Soc. Jpn. 63 1422
[10] Park J H, Hong Y K, Bae S, Lee J J, Jalli J, Abo G S, Neveu N, Kim S G, Choi C J, Lee J G 2010 J. Appl. Phys. 107 09A731
[11] Sands T, Harbison J P, Leadbeater M L, Allen S J, Hull G W, Ramesh R, Keramidas V G 1990 Appl. Phys. Lett. 57 2609
[12] Lauhoff G, Bruynseraede C, De Boeck J, Van Roy W, Bland J A C, Borghs G 1997 Phys. Rev. Lett. 79 5290
[13] Van Roy W, De Boeck J, Bender H, Bruynseraede C, Vanesch A, Borghs G 1995 J. Appl. Phys. 78 398
[14] Hosoda M, Oogane M, Kubota M, Kubota T, Saruyama H, Iihama S, Naganuma H, Ando Y 2012 J. Appl. Phys. 111 07A324
[15] Nie S H, Zhu L J, Lu J, Pan D, Wang H L, Yu X Z, Xiao J X, Zhao J H 2013 Appl. Phys. Lett. 102 152405
[16] Yan Z C, Huang Y, Zhang Y C, Hadjipanayis G, Soffa W, Weller D 2005 Scr. Mater. 53 463
-
[1] Zhu Y, Cai J W 2005 Acta Phys. Sin. 54 393 (in Chinese) [竺云, 蔡建旺 2005 物理学报 54 393]
[2] Feng C, Li B H, Teng J, Yang T, Yu G H 2005 Acta Phys. Sin. 54 4898 (in Chinese) [冯春, 李宝河, 滕蛟, 杨涛, 于广华 2005 物理学报 54 4898]
[3] Wang H, Yang F J, Xue S X, Cao X, Wang J A, Gu H S, Zhao Z Q 2005 Acta Phys. Sin. 54 1415 (in Chinese) [王浩, 杨辅军, 薛双喜, 曹歆, 王君安, 顾豪爽, 赵子强 2005 物理学报 54 1415]
[4] Weller D, Moser A, Folks L, Best M E, Lee W, Toney M F, Schwickert M, Thiele J U, Doerner M F 2001 IEEE Trans. on Magn. 36 10
[5] Zhang X H 2010 Master. Dissertation (Shanghai: Fudan University) (in Chinese) [张旭辉 2010 硕士学位论文 (上海: 复旦大学)]
[6] Gerhardt N C, Hovel S, Brenner C, Hofmann M R, Lo F Y, Reuter D, Wieck A D, Schuster E, Keune W, Westerholt K 2005 Appl. Phys. Lett. 87 032502
[7] Tehrani S, Slaughter J M, Chen E, Durlam M, Shi J, DeHerrera M 1999 IEEE Trans. Magn. 35 2814
[8] Koch A J J, Hokkeling P, Steeg M G, Vos K J 1960 J. Appl. Phys. 31 75S
[9] Sakuma A 1994 J. Phys. Soc. Jpn. 63 1422
[10] Park J H, Hong Y K, Bae S, Lee J J, Jalli J, Abo G S, Neveu N, Kim S G, Choi C J, Lee J G 2010 J. Appl. Phys. 107 09A731
[11] Sands T, Harbison J P, Leadbeater M L, Allen S J, Hull G W, Ramesh R, Keramidas V G 1990 Appl. Phys. Lett. 57 2609
[12] Lauhoff G, Bruynseraede C, De Boeck J, Van Roy W, Bland J A C, Borghs G 1997 Phys. Rev. Lett. 79 5290
[13] Van Roy W, De Boeck J, Bender H, Bruynseraede C, Vanesch A, Borghs G 1995 J. Appl. Phys. 78 398
[14] Hosoda M, Oogane M, Kubota M, Kubota T, Saruyama H, Iihama S, Naganuma H, Ando Y 2012 J. Appl. Phys. 111 07A324
[15] Nie S H, Zhu L J, Lu J, Pan D, Wang H L, Yu X Z, Xiao J X, Zhao J H 2013 Appl. Phys. Lett. 102 152405
[16] Yan Z C, Huang Y, Zhang Y C, Hadjipanayis G, Soffa W, Weller D 2005 Scr. Mater. 53 463
Catalog
Metrics
- Abstract views: 7682
- PDF Downloads: 463
- Cited By: 0