-
The accuracy of the model for secondary electron yield (SEY) has a remarkable influence on the simulation result of multipactor threshold. A new combined phenomenological model for SEY was proposed based on the corrected Vaughan model and Furman model. It combines virtues of the latter two models by integrating corrected Vaughan model into Furman model for its calculation of yield of true secondary electron. The new model provides high flexibility and accuracy to fit experimental data of SEY as a function. For comparison, experimental data of silver and aluminum alloys were tested with the three models. It was found that the fitting accuracy has been improved by at least 10% under the circumstances of different incident angles of the original electron.
[1] Flyckt S O, Marmonier C 2002 Photomultiplier Tubes: Principles and Applications (France: Photonis Brive)
[2] Bogaerts A, Neyts E, Gijbels R, Mullen J V 2002 Spectrochim. Acta. B 57 609
[3] Hoff B W, Mardahl P J, Gilgenbach R M, Haworth M D, French D M, Lau Y Y, Franzi M 2009 Rev. Sci. Instrum. 80 094702
[4] Shiffler D, Baca G, Englert T, Haworth M D, Hendricks K J, Henley D, Sena M, Spencer T A IEEE T. Plasma Sci. 26 304
[5] Kudsia C, Cameron R, Tang W C 1992 IEEE T. Microw. Theory 40 1133
[6] Graves T P, La Bombard B, Wukitch S, Hutchinson I 2006 Rev. Sci. Instrum. 77 014701
[7] Gengy R L, Belomestnykh S H Padamsee, Reilly J, Goudketz P, Dykes D M, Carter R G 2002 Proceedings of EPAC Paris, France p2238
[8] Kishek R A, Lau Y Y, Ang L K, Valfells A, Gilgenbach R M 1998 Phys. Plasmas 5 2120
[9] Sazontov A G, Sazontov V A, Vdovicheva N K 2008 Contrib Plasma Phys. 48 331
[10] Burt G, Carter R G, Dexter A C, Hall B, Smith J D A, Goudket P 2009 Proceedings of SRF 2009 Berlin, Germany Sept. 20-25, 2009 p321
[11] Nieter C, Stoltz P H, Roark C, Mahalingam S 2010 AIP Conf Proc 1299 399
[12] Rodney J, Vaughan M 1989 IEEE T Electron Dev. 36 1963
[13] Furman M A, Pivi M T F 2003 Tech. Rep. (Lawrence Berkeley National Laboratory, No. SLAC-PUB-9912/LBNL-49771)
[14] Reimer L, Drescher H 1977 J. Phys. D: Appl. Phys. 10 805
[15] Anza S, Vicente C, Gimeno B, Boria V E, Armendáriz J 2007 Phys. Plasmas 14 082112
[16] Balcon N, Payan D, Belhaj M, Tondu T, Inguimbert V 2012 IEEE T. Plasma Sci. 40 282
[17] Zhan Z H, Zhang J, Li Y, Chung H S H 2009 IEEE T Syst. Man. Cy. A 39 1362
-
[1] Flyckt S O, Marmonier C 2002 Photomultiplier Tubes: Principles and Applications (France: Photonis Brive)
[2] Bogaerts A, Neyts E, Gijbels R, Mullen J V 2002 Spectrochim. Acta. B 57 609
[3] Hoff B W, Mardahl P J, Gilgenbach R M, Haworth M D, French D M, Lau Y Y, Franzi M 2009 Rev. Sci. Instrum. 80 094702
[4] Shiffler D, Baca G, Englert T, Haworth M D, Hendricks K J, Henley D, Sena M, Spencer T A IEEE T. Plasma Sci. 26 304
[5] Kudsia C, Cameron R, Tang W C 1992 IEEE T. Microw. Theory 40 1133
[6] Graves T P, La Bombard B, Wukitch S, Hutchinson I 2006 Rev. Sci. Instrum. 77 014701
[7] Gengy R L, Belomestnykh S H Padamsee, Reilly J, Goudketz P, Dykes D M, Carter R G 2002 Proceedings of EPAC Paris, France p2238
[8] Kishek R A, Lau Y Y, Ang L K, Valfells A, Gilgenbach R M 1998 Phys. Plasmas 5 2120
[9] Sazontov A G, Sazontov V A, Vdovicheva N K 2008 Contrib Plasma Phys. 48 331
[10] Burt G, Carter R G, Dexter A C, Hall B, Smith J D A, Goudket P 2009 Proceedings of SRF 2009 Berlin, Germany Sept. 20-25, 2009 p321
[11] Nieter C, Stoltz P H, Roark C, Mahalingam S 2010 AIP Conf Proc 1299 399
[12] Rodney J, Vaughan M 1989 IEEE T Electron Dev. 36 1963
[13] Furman M A, Pivi M T F 2003 Tech. Rep. (Lawrence Berkeley National Laboratory, No. SLAC-PUB-9912/LBNL-49771)
[14] Reimer L, Drescher H 1977 J. Phys. D: Appl. Phys. 10 805
[15] Anza S, Vicente C, Gimeno B, Boria V E, Armendáriz J 2007 Phys. Plasmas 14 082112
[16] Balcon N, Payan D, Belhaj M, Tondu T, Inguimbert V 2012 IEEE T. Plasma Sci. 40 282
[17] Zhan Z H, Zhang J, Li Y, Chung H S H 2009 IEEE T Syst. Man. Cy. A 39 1362
Catalog
Metrics
- Abstract views: 8991
- PDF Downloads: 854
- Cited By: 0
下载:
