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Raman光谱研究厚度对La0.9Sr0.1MnO3/Si薄膜结构的影响

刘雪芹 韩国俭 黄春奎 兰伟

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Raman光谱研究厚度对La0.9Sr0.1MnO3/Si薄膜结构的影响

刘雪芹, 韩国俭, 黄春奎, 兰伟

Thickness dependence of microstructure for La0.9Sr0.1MnO3/Si films determined by micro-Raman spectroscopy

Liu Xue-Qin, Han Guo-Jian, Huang Chun-Kui, Lan Wei
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  • 通过溶胶-凝胶旋涂方法结合后退火工艺在Si(100)上制备了不同厚度的La0.9Sr0.1MnO3(LSMO)薄膜,利用X射线衍射(XRD)和共焦显微拉曼散射(Raman)研究了LSMO/Si(100)薄膜的微结构.研究结果表明90 nm厚的LSMO薄膜具有正交相结构,当厚度大于150 nm时,薄膜具有菱方相结构. 150 nm厚的薄膜的Raman图谱中,490 cm-1和602 cm-1正交结构
    La0.9Sr0.1MnO3 films on Si (100) substrate of different thickness were prepared by sol-gel routine, and the microstructure of LSMO/Si was studied by XRD and confocal micro Raman spectroscopy. Both XRD and Raman results show different structures in LSMO films of different thickness. There are two strong peaks around 490 cm-1and 600 cm-1 that is characteristic of Jahn-Teller distortion in spectra and characteristic peak of rhombohedral structure of the film with thickness of 90 nm, which show the coexistence of two phases. Lattice constants of LSMO film vary with film thickness. Lattice constants vary as film thickness increases, which is because the tilting angle of MnO6 octahedron and the bond length of Mn-O increase as film thickness increases. Raman spectra of 532 nm-laser and 325 nm-laser show, that there are two phases existing in LSMO/Si film, namely the phase in LSMO/Si interface, and the rhombohedral phase in the surface.
    • 基金项目: 国家自然科学基金(批准号: 50872047)资助的课题.
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  • 文章访问数:  4938
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  • 被引次数: 0
出版历程
  • 收稿日期:  2009-01-08
  • 修回日期:  2009-03-27
  • 刊出日期:  2009-11-20

Raman光谱研究厚度对La0.9Sr0.1MnO3/Si薄膜结构的影响

  • 1. 兰州大学物理科学与技术学院,兰州 730000
    基金项目: 国家自然科学基金(批准号: 50872047)资助的课题.

摘要: 通过溶胶-凝胶旋涂方法结合后退火工艺在Si(100)上制备了不同厚度的La0.9Sr0.1MnO3(LSMO)薄膜,利用X射线衍射(XRD)和共焦显微拉曼散射(Raman)研究了LSMO/Si(100)薄膜的微结构.研究结果表明90 nm厚的LSMO薄膜具有正交相结构,当厚度大于150 nm时,薄膜具有菱方相结构. 150 nm厚的薄膜的Raman图谱中,490 cm-1和602 cm-1正交结构

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