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中带电压法分离栅控横向pnp双极晶体管辐照感生缺

席善斌 陆妩 王志宽 任迪远 周东 文林 孙静

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中带电压法分离栅控横向pnp双极晶体管辐照感生缺

席善斌, 陆妩, 王志宽, 任迪远, 周东, 文林, 孙静

Use the subthreshold-current technique to separate radiation induced defects in gate controlled lateral pnp bipolar transistors

Xi Shan-Bin, Lu Wu, Wang Zhi-Kuan, Ren Di-Yuan, Zhou Dong, Wen Lin, Sun Jing
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  • 设计并制作了一种新型双极测试结构,即在常规横向pnp双极晶体管基区表面氧化层上淀积一栅电极,通过扫描栅极所加电压,获得漏极(集电极)电流随栅极电压的变化特性,利用中带电压法分离栅控横向pnp双极晶体管在辐照过程中感生的氧化物陷阱电荷和界面陷阱电荷.本文对设计的晶体管测试结构和采用的测试方法做了具体介绍.
    In this paper, we design and fabricate a new test structure of bipolar device. A gate is deposited on the oxide layer covering the base region of normal lateral pnp bipolar transistor. The characteristic of drain current (collector current) versus the gate voltage is recorded by sweeping the voltage applied to the gate, then the subthreshold-current technique is used to separate the radiation induced oxide trapped charges and interface traps in the gate controlled lateral pnp bipolar transistor during 60Co- irradiation. The test structure and the measurement of the bipolar transistor used in the experiment are introduced in detail in this paper.
    • 基金项目: 国家自然科学基金(批准号: 10975182)资助的课题.
    • Funds: Project supported by the National Natural Science Foundation of China (Grant No. 10975182).
    [1]

    Enlow E W, Pease R L, Combs W, Schrimpf R D, Nowlin R N 1991 IEEE Trans. Nucl. Sci. 38 1342

    [2]

    Fleetwood D M, Kosier S L, Nowlin R N, Schrimpf R D, Reber R A, DeLaus M, Winokur P S. Wei A, Combs W E, Pease R L 1994 IEEE Trans. Nucl. Sci. 41 1871

    [3]

    Hjalmarson H P, Pease R L, Witczak S C, Shaneyfelt M R, Schwank J R, Edwards A H, Hembree C E, Mattsson T R 2003 IEEE Trans. Nucl. Sci. 50 1901

    [4]

    Zhang Y Q, Liu C Y, Liu J L, Wang J P, Huang Z, Xu N J, He B P, Peng H L, Yao Y J 2001 Acta Phys. Sin. 50 2434 (in Chinese) [张廷庆, 刘传洋, 刘家璐, 王剑屏, 黄智, 徐娜军, 何宝平, 彭宏论, 姚育娟 2001 物理学报 50 2434]

    [5]

    He B P, Guo H X, Gong J C, Wang G Z, Luo Y H, Li Y H 2004 Acta Phys. Sin. 53 3125 (in Chinese) [何宝平, 郭红霞, 龚建成, 王桂珍, 罗尹虹, 李永宏 2004 物理学报 53 3125]

    [6]

    Zheng Y Z, Lu W, Ren D Y, Wang Y Y, Guo Q, Yu X G, He C F 2009 Acta Phys. Sin. 58 5572 (in Chinese) [郑玉展, 陆妩, 任迪远, 王义元, 郭旗, 余学锋, 何承发 2009 物理学报 58 5572]

    [7]

    He B P, Yao Z B 2010 Acta Phys. Sin. 59 1985 (in Chinese) [何宝平, 姚志斌 2010 物理学报 59 1985]

    [8]

    Chen X J, Barnaby H J,Pease R L, Schrimpf R D, Platteter D G, Dunham G 2004 IEEE Trans. Nucl. Sci. 51 3178

    [9]

    Chen X J, Barnaby H J, Pease R L, Schrimpf R D, Platteter D, Shaneyfelt M, Vermeire B 2005 IEEE Trans. Nucl. Sci. 52 2245

    [10]

    Ball D R, Schrimpf R D, Barnaby H J 2002 IEEE Trans. Nucl. Sci. 49 3185

    [11]

    Chen X J, Barnaby H J, Schrimpf R D, Fleetwood D M, Pease R L, Platteter D G, Dunham G W 2006 IEEE Trans. Nucl. Sci. 53 3649

    [12]

    Chen X J, Barnaby H J, Vermeire B, Holbert K, Wright D, Pease R L, Dunham G, Platteter D G, Seiler J, McClure S, Adell P 2007 IEEE Trans. Nucl. Sci. 54 1913

    [13]

    Chen X J, Barnaby H J, Vermeire B, Holbert K E, Wright D, Pease R L, Schrimpf R D, Fleetwood D M, Pantelides S T, Shaneyfelt M R, Adell P 2008 IEEE Trans. Nucl. Sci. 55 3032

    [14]

    Minson E, Sanchez I, Barnaby H J, Pease R L, Platteter D G, Dunham G 2004 IEEE Trans. Nucl. Sci. 51 3723

    [15]

    Hart Arthur R, Smyth J B, van Lint, Victor A J, Snowden D P, Leadon Roland E 1978 IEEE Trans. Nucl. Sci. 25 1502

    [16]

    Kosier S L, Shrimpf R D, Nowlin R N, Fleetwood D M, DeLaus M, Pease R L, CombsWE,Wei A, Chai F 1993 IEEE Trans. Nucl. Sci. 40 1276

    [17]

    McWhorter P J, Winokur P S 1986 Appl Phys. Lett. 48 133

    [18]

    Gaitan M, Russell T J 1984 IEEE Trans. Nucl. Sci. 31 1256

    [19]

    Pease R, Emily D, Boesch H E 1985 IEEE Trans. Nucl. Sci. 32 3946

    [20]

    He Y J, Shi Q, Li B, Luo H W, Lin L 2006 Electronic Product Reliability and Environmental Testing 24 26 (in Chinese) [何玉娟, 师谦, 李斌, 罗宏伟, 林丽 2006 电子产品可靠性与环境试验 24 26]

  • [1]

    Enlow E W, Pease R L, Combs W, Schrimpf R D, Nowlin R N 1991 IEEE Trans. Nucl. Sci. 38 1342

    [2]

    Fleetwood D M, Kosier S L, Nowlin R N, Schrimpf R D, Reber R A, DeLaus M, Winokur P S. Wei A, Combs W E, Pease R L 1994 IEEE Trans. Nucl. Sci. 41 1871

    [3]

    Hjalmarson H P, Pease R L, Witczak S C, Shaneyfelt M R, Schwank J R, Edwards A H, Hembree C E, Mattsson T R 2003 IEEE Trans. Nucl. Sci. 50 1901

    [4]

    Zhang Y Q, Liu C Y, Liu J L, Wang J P, Huang Z, Xu N J, He B P, Peng H L, Yao Y J 2001 Acta Phys. Sin. 50 2434 (in Chinese) [张廷庆, 刘传洋, 刘家璐, 王剑屏, 黄智, 徐娜军, 何宝平, 彭宏论, 姚育娟 2001 物理学报 50 2434]

    [5]

    He B P, Guo H X, Gong J C, Wang G Z, Luo Y H, Li Y H 2004 Acta Phys. Sin. 53 3125 (in Chinese) [何宝平, 郭红霞, 龚建成, 王桂珍, 罗尹虹, 李永宏 2004 物理学报 53 3125]

    [6]

    Zheng Y Z, Lu W, Ren D Y, Wang Y Y, Guo Q, Yu X G, He C F 2009 Acta Phys. Sin. 58 5572 (in Chinese) [郑玉展, 陆妩, 任迪远, 王义元, 郭旗, 余学锋, 何承发 2009 物理学报 58 5572]

    [7]

    He B P, Yao Z B 2010 Acta Phys. Sin. 59 1985 (in Chinese) [何宝平, 姚志斌 2010 物理学报 59 1985]

    [8]

    Chen X J, Barnaby H J,Pease R L, Schrimpf R D, Platteter D G, Dunham G 2004 IEEE Trans. Nucl. Sci. 51 3178

    [9]

    Chen X J, Barnaby H J, Pease R L, Schrimpf R D, Platteter D, Shaneyfelt M, Vermeire B 2005 IEEE Trans. Nucl. Sci. 52 2245

    [10]

    Ball D R, Schrimpf R D, Barnaby H J 2002 IEEE Trans. Nucl. Sci. 49 3185

    [11]

    Chen X J, Barnaby H J, Schrimpf R D, Fleetwood D M, Pease R L, Platteter D G, Dunham G W 2006 IEEE Trans. Nucl. Sci. 53 3649

    [12]

    Chen X J, Barnaby H J, Vermeire B, Holbert K, Wright D, Pease R L, Dunham G, Platteter D G, Seiler J, McClure S, Adell P 2007 IEEE Trans. Nucl. Sci. 54 1913

    [13]

    Chen X J, Barnaby H J, Vermeire B, Holbert K E, Wright D, Pease R L, Schrimpf R D, Fleetwood D M, Pantelides S T, Shaneyfelt M R, Adell P 2008 IEEE Trans. Nucl. Sci. 55 3032

    [14]

    Minson E, Sanchez I, Barnaby H J, Pease R L, Platteter D G, Dunham G 2004 IEEE Trans. Nucl. Sci. 51 3723

    [15]

    Hart Arthur R, Smyth J B, van Lint, Victor A J, Snowden D P, Leadon Roland E 1978 IEEE Trans. Nucl. Sci. 25 1502

    [16]

    Kosier S L, Shrimpf R D, Nowlin R N, Fleetwood D M, DeLaus M, Pease R L, CombsWE,Wei A, Chai F 1993 IEEE Trans. Nucl. Sci. 40 1276

    [17]

    McWhorter P J, Winokur P S 1986 Appl Phys. Lett. 48 133

    [18]

    Gaitan M, Russell T J 1984 IEEE Trans. Nucl. Sci. 31 1256

    [19]

    Pease R, Emily D, Boesch H E 1985 IEEE Trans. Nucl. Sci. 32 3946

    [20]

    He Y J, Shi Q, Li B, Luo H W, Lin L 2006 Electronic Product Reliability and Environmental Testing 24 26 (in Chinese) [何玉娟, 师谦, 李斌, 罗宏伟, 林丽 2006 电子产品可靠性与环境试验 24 26]

计量
  • 文章访问数:  6137
  • PDF下载量:  668
  • 被引次数: 0
出版历程
  • 收稿日期:  2011-05-31
  • 修回日期:  2012-04-05
  • 刊出日期:  2012-04-05

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