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热致变色相变复合绝缘在电热激励下能实现一系列先进功能，已广泛应用于大量智能电气与电子设备中. 然而热致变色相变复合绝缘存在限域结构，无法通过现有的纳米复合界面模型分析其电荷陷阱特性，导致其在电热耦合应力下的介电可靠性提升缺乏科学依据. 本文通过等温表面电位衰减（ISPD）、开尔文探针力显微镜（KPFM）等方法，研究了热致变色相变环氧复合绝缘的电荷陷阱特性与机理. 结果表明：30℃和70℃下限域结构对热致变色相变环氧绝缘陷阱特性的影响趋势相反，可能源于限域相变或限域界面的影响. 理论分析发现，限域相变对陷阱温度特性的影响规律与实验结果不符，并非影响陷阱温度特性的主要原因. 通过KPFM原位表征直接验证了限域界面内存在势垒，且起源于接触起电机制. 限域界面接触起电电荷量随温度的变化会影响限域界面势垒高度，是影响陷阱温度特性的主要原因.
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关键词:
- 热致变色相变复合绝缘 /
- 陷阱特性 /
- 开尔文探针力显微镜 /
- 接触起电
Thermochromic phase change insulating composite can realize a series of advanced functions under electrothermal stimuli, which has been widely applied in numbers of intelligent electrical and electronic devices. However, due to the confined structure of thermochromic phase change insulating composite, the trap characteristics cannot be analyzed by current interface models of nanodielectrics, inhibiting the scientific improvement of dielectric reliability under the electrothermal stress. In this paper, the trap characteristic and mechanism of thermochromic phase change epoxy composites are studied by the isothermal surface potential decay (ISPD) and the Kelvin probe force microscopy (KPFM). Results show that the variation trends of trap characteristics after introducing confined structures are opposite at 30℃ and 70℃, which could derive from the confined phase change or the confined interface. Theoretical analysis shows that the influence of confined phase change on temperature dependent trap characteristics is inconsistent with experimental results, which could not be the essential reason influencing the trap characteristics. KPFM in-situ characterization directly verifies the existence of potential barriers in the confined interface, which originates from the contact electrification mechanism. The temperature dependent charge quantity variation due to contact electrification at the confined interface could impact the barrier height, which substantially affecting the temperature dependent trap characteristics.-
Keywords:
- thermochromic phase change insulating composite /
- trap characteristic /
- Kelvin probe force microscopy /
- contact electrification
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