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Experimental analysis of charge transfer efficiency degradation of charge coupled devices induced by proton irradiation

Wang Zu-Jun Tang Ben-Qi Xiao Zhi-Gang Liu Min-Bo Huang Shao-Yan Zhang Yong

Citation:

Experimental analysis of charge transfer efficiency degradation of charge coupled devices induced by proton irradiation

Wang Zu-Jun, Tang Ben-Qi, Xiao Zhi-Gang, Liu Min-Bo, Huang Shao-Yan, Zhang Yong
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  • Abstract views:  9129
  • PDF Downloads:  802
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Publishing process
  • Received Date:  17 September 2009
  • Accepted Date:  10 December 2009
  • Published Online:  05 March 2010

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