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中国物理学会期刊

基于Ga2O3-SiC-Ag多层结构的介电常数近零超低开关阈值光学双稳态器件

CSTR: 32037.14.aps.73.20231534

Ultralow switching threshold optical bistable devices based on epsilon-near-zero Ga2O3-SiC-Ag multilayer structures

CSTR: 32037.14.aps.73.20231534
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  • 光学双稳态这一非线性光学现象因其在全光系统中的巨大应用潜力而备受关注. 然而微弱的非线性响应往往需要巨大的输入功率才能实现光学双稳态, 导致其实用性不强. 本文基于Ga2O3-SiC-Ag的金属-介电材料多层结构, 在实现介电常数近零的大场增强的同时, 还引入了具有大非线性系数的材料, 并基于有限元法研究了介电常数近零层的厚度和长度对光学双稳态的影响. 研究结果表明, 光学双稳态随介电常数近零层的厚度和长度的增大而变得愈发显著, 在通信波段的开关阈值低至约 10–6 W/cm2, 与之前报道的基于介电常数近零材料的光学双稳态相比, 降低了9个数量级, 展现了在光子集成电路产业化中的巨大应用潜力.

     

    Optical bistability has attracted much attention due to its enormous potential applications in all-optical operation and signal processing. However, the weak nonlinear responses typically require huge pump power to reach the threshold of the optical bistability, thus hindering the real applications. In this study, we propose an efficient optical bistable metamaterial, which is composed of multilayer Ga2O3-SiC-Ag metal-dielectric nanostructures. We not only use the epsilon-near-zero (ENZ) with SiC-Ag thin layers to enhance the substantial field, but also incorporate the SiC material to increase its significant optical nonlinear coefficient. In the structural design, the introduction of Ga2O3 layer facilitates the light field concentration, contributing to the further reduction in threshold power for optical bistability, and also conducing to the improvement of the physical and chemical stability of the device. The influences of the thickness and length of the ENZ layer on the optical bistability are systematically investigated by using the finite element method. The results demonstrate that optical bistability becomes more pronounced with the increase of the thickness and length of ENZ layer, exhibiting a bistability switching threshold as low as ~10–6 W/cm2 in the telecommunication band. Comparing with the previously reported optical bistability based on ENZ mechanism, the threshold shows a significant reduction by 9 orders of magnitude, demonstrating great application potential in the fields of semiconductor devices and photonic integrated circuits.

     

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