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Structual and optoelectronic properties of polycrystalline silicon thin films p repared by hot-wire chemical vapor deposition at low temperatures

Wang Liu-Jiu Zhu Mei-Fang Liu Feng-Zhen Liu Jin-Long Han Yi-Qin

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Structual and optoelectronic properties of polycrystalline silicon thin films p repared by hot-wire chemical vapor deposition at low temperatures

Wang Liu-Jiu, Zhu Mei-Fang, Liu Feng-Zhen, Liu Jin-Long, Han Yi-Qin
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  • Abstract views:  7881
  • PDF Downloads:  1164
  • Cited By: 0
Publishing process
  • Received Date:  21 January 2003
  • Accepted Date:  28 March 2003
  • Published Online:  20 November 2003

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