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Tao Hai-Yan, Chen Rui, Song Xiao-Wei, Chen Ya-Nan, Lin Jing-Quan. Femtosecond laser pulse energy accumulation optimization effect on surface morphology of black silicon. Acta Physica Sinica,
2017, 66(6): 067902.
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Dong Xiang-Lei, Xing Hui, Chen Chang-Le, Sha Sha, Wang Jian-Yuan, Jin Ke-Xin. Phase-Field Modeling of Facet Hexagonal Spirals with Anisotropy, Deposition, and Kinetic Effects. Acta Physica Sinica,
2016, 65(2): 020701.
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Pan Xiao, Ju Huan-Xin, Feng Xue-Fei, Fan Qi-Tang, Wang Chia-Hsin, Yang Yaw-Wen, Zhu Jun-Fa. Surface morphology of F8BT films and interface structures and reactions of Al on F8BT films. Acta Physica Sinica,
2015, 64(7): 077304.
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Jing Wei-Xuan, Wang Bing, Niu Ling-Ling, Qi Han, Jiang Zhuang-De, Chen Lu-Jia, Zhou Fan. Relationships between synthesizing parameters, morphology, and contact angles of ZnO nanowire films. Acta Physica Sinica,
2013, 62(21): 218102.
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Peng Shu-Ming, Shen Hua-Hai, Long Xing-Gui, Zhou Xiao-Song, Yang Li, Zu Xiao-Tao. The influence of deuteration and helium-implantation on the surface morphology and phase structure of scandium thick film. Acta Physica Sinica,
2012, 61(17): 176106.
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Li Xin-Li, Gu Jin-Hua, Gao Hai-Bo, Chen Yong-Sheng, Gao Xiao-Yong, Yang Shi-E, Lu Jing-Xiao, Li Rui, Jiao Yue-Chao. Real time and ex situ spectroscopic ellipsometry analysis microcrystalline silicon thin films growth. Acta Physica Sinica,
2012, 61(3): 036802.
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Gao Hai-Bo, Li Rui, Lu Jing-Xiao, Wang Guo, Li Xin-Lin, Jiao Yue-Chao. High-rate deposition of microcrystalline silicon thin film by multi-step method. Acta Physica Sinica,
2012, 61(1): 018101.
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Cao Yue-Hua, Di Guo-Qing. Analysis of Y2O3 doped TiO2 films topography prepared by radio frequency magnetron sputtering. Acta Physica Sinica,
2011, 60(3): 037702.
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Di Guo-Qing. Surface morphology and optical properties of Ta2O5 films prepared by radio frequency sputtering. Acta Physica Sinica,
2011, 60(3): 038101.
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Ding Yan-Li, Zhu Zhi-Li, Gu Jin-Hua, Shi Xin-Wei, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao. Effect of deposition rate on the scaling behavior of microcrystalline silicon films prepared by very high frequency-plasma enhanced chemical vapor deposition. Acta Physica Sinica,
2010, 59(2): 1190-1195.
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Han Xiao-Yan, Hou Guo-Fu, Wei Chang-Chun, Zhang Xiao-Dan, Dai Zhi-Hua, Li Gui-Jun, Sun Jian, Chen Xin-Liang, Zhang De-Kun, Xue Jun-Ming, Zhao Ying, Geng Xin-Hua. Optimization of high rate growth high quality μc-Si:H thin films and its application to the solar cells. Acta Physica Sinica,
2009, 58(6): 4254-4259.
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Han Xiao-Yan, Geng Xin-Hua, Hou Guo-Fu, Zhang Xiao-Dan, Li Gui-Jun, Yuan Yu-Jie, Wei Chang-Chun, Sun Jian, Zhang De-Kun, Zhao Ying. An optical emission spectroscopy study on the high rate growth of microcrystalline silicon films. Acta Physica Sinica,
2009, 58(2): 1344-1347.
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Jiang Yang, Luo Yi, Xi Guang-Yi, Wang Lai, Li Hong-Tao, Zhao Wei, Han Yan-Jun. Effect of AlGaN intermediate layer on residual stress control and surface morphology of GaN grown on 6H-SiC substrate by metal organic vapour phase epitaxy. Acta Physica Sinica,
2009, 58(10): 7282-7287.
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Gu Jin-Hua, Ding Yan-Li, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao. A spectroscopic ellipsometry study of the abnormal scaling behavior of high-rate-deposited microcrystalline silicon films by VHF-PECVD technique. Acta Physica Sinica,
2009, 58(6): 4123-4127.
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Guo Xue-Jun, Lu Jing-Xiao, Chen Yong-Sheng, Zhang Qing-Feng, Wen Shu-Tang, Zheng Wen, Shen Chen-Hai, Chen Qing-Dong. Research on the high-rate deposition of μc-Si:H by VHF-PECVD. Acta Physica Sinica,
2008, 57(9): 6002-6006.
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Yang Ji-Jun, Xu Ke-Wei. Surface dynamic evolution of Ta film growth in the initial stage. Acta Physica Sinica,
2007, 56(10): 6023-6027.
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Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing. Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity. Acta Physica Sinica,
2007, 56(4): 2422-2427.
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Wang Yuan, Bai Xuan-Yu, Xu Ke-Wei. Morphological characterization and nanoindentation hardness scatter evaluation for Cu-W thin films based on wavelet transform. Acta Physica Sinica,
2004, 53(7): 2281-2286.
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Wang Liu-Jiu, Zhu Mei-Fang, Liu Feng-Zhen, Liu Jin-Long, Han Yi-Ｑin. Structual and optoelectronic properties of polycrystalline silicon thin films p repared by hot-wire chemical vapor deposition at low temperatures. Acta Physica Sinica,
2003, 52(11): 2934-2938.
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LIAO MEI-YONG, QIN FU-GUANG, CHAI CHUN-LIN, LIU ZHI-KAI, YANG SHAO-YAN, YAO ZHEN-YU, WANG ZHAN-GUO. INFLUENCE OF ION ENERGY AND DEPOSITION TEMPERATURE ON THE SURFACE MORPHOLOGY OF CARBON FILMS DEPOSITED BY ION BEAMS. Acta Physica Sinica,
2001, 50(7): 1324-1328.
doi: 10.7498/aps.50.1324
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