State-resolved electron capture in low-energy Ar<sup>2+</sup>-Ar/N<sub>2</sub> collisions

CUI Shucheng; XING Dadi; ZHU Xiaolong; ZHAO Dongmei; GUO Dalong; GAO Yong; ZHANG Shaofeng; DONG Chenzhong; MA Xinwen

doi:10.7498/aps.74.20251146

Abstract

As a fundamental process in atomic physics, charge exchange relies on quantum state-resolved data that is crucial for various fields such as astrophysics and plasma physics. However, there remains a gap in the research on multi-electron target systems. This study aims to investigate the dynamic mechanisms of single/double electron capture in collisions between Ar²⁺ ions and Ar atoms or N₂ molecules at an energy of 40 keV, thereby supplementing high-precision experimental data in this field. The experiment is conducted on the electron beam ion source (EBIS) platform at the Institute of Modern Physics, Chinese Academy of Sciences, using the cold target recoil ion momentum spectroscopy (COLTRIMS) technique. An ion beam containing ground-state Ar²⁺ (3s²3p⁴ ³P) and metastable Ar²⁺ (3s²3p⁴ ¹D, ¹S) is used as the projectile, colliding with a supersonic Ar/N₂ mixed gas target. Three-dimensional momentum of recoil ions is reconstructed through coincidence measurements of recoil ions and scattered ions, and the Q-value and scattering angle distribution are calculated. Theoretical comparisons are performed using the molecular Coulombic over barrier model (MCBM).The results show that there are similarities in the populations of single-electron captured states between the two systems, but the contribution ratios are different: the Q-value spectrum of the Ar²⁺-Ar system contains an additional characteristic peak, which corresponds to the process where the projectile ion captures an electron from the 3s orbital of the target while its own 3s electron is excited to the 3p orbital. In contrast, this characteristic peak is absent in the Ar²⁺-N₂ system due to the easy dissociation of excited $ \text{N}_{2}^{+} $ ions. For double-electron capture, both systems are dominated by capturing electrons to the ground state, but only the Ar²⁺-N₂ system shows a significant contribution from excited state populations. The comparison of scattering angles reveals that the higher the capture state of the product ion, the larger the corresponding scattering angle is and the smaller the impact parameter is. This is presumably because electron interactions become more complex at smaller impact parameters, leading to a higher probability of capturing electrons to high-energy levels. In the double-electron capture of the Ar²⁺-N₂ system, only the ground-state channel is populated at small angles (0–1.2 mrad). Additionally, electron capture exhibits dependence on impact parameter: as the angle increases (i.e. the impact parameter decreases), the Q-value of the capture reaction decreases, indicating that the reaction tends to be more endothermic.

Keywords:

Authors and contacts

1.
Key Laboratory of Atomic and Molecular Physics & Functional Materials of Gansu Province, College of Physics and Electronic Engineering, Northwest Normal University, Lanzhou 730070, China
2.
Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
3.
State Key Laboratory of Heavy Ion Science and Technology, Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
4.
University of Chinese Academy of Sciences, Beijing 100049, China

Corresponding author: ZHU Xiaolong, zhuxiaolong@impcas.ac.cn ; DONG Chenzhong, dongcz@nwnu.edu.cn ;

Funds: Project supported by the National Key Research and Development Program of China (Grant No. 2022YFA1602500) and the Natural Science Foundation of Gansu Province, China (Grant No. 25JRRA461).

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References

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Cited By

图 1 40 keV 能量下 Ar²⁺-Ar 碰撞中电子俘获过程的Q 值分布　(a) 单电子俘获; (b) 双电子俘获

Figure 1. Q-value distributions for electron capture processes in Ar²⁺-Ar collisions at 40 keV: (a) Single electron capture; (b) double electron capture.

DownLoad: Full-Size Img PowerPoint

图 2 40 keV能量下Ar²⁺-Ar碰撞过程的单、双电子俘获的散射角分布. 红色实线表示MCBM计算的散射角分布. 黑色竖线为辅助线, 竖线右侧为未完全收集的部分

Figure 2. Scattering angle distributions for single and double electron capture in the collision process of Ar²⁺-Ar at 40 keV energy. The red solid line represents the angular differential cross-section calculated by MCBM. The black vertical lines are auxiliary lines, and the region to the right of the vertical lines indicates the incompletely collected portion

DownLoad: Full-Size Img PowerPoint

图 3 40 keV 能量下 Ar²⁺-N₂ 碰撞中电子俘获过程的 Q 值分布　(a) 单电子俘获; (b) 双电子俘获

Figure 3. Q-value distributions for electron capture processes in Ar²⁺-N₂ collisions at 40 keV: (a) Single electron capture; (b) double electron capture.

DownLoad: Full-Size Img PowerPoint

图 4 40 keV能量下Ar²⁺-N₂碰撞过程的单、双电子俘获的散射角分布　(a)单电子俘获过程; (b)双电子俘获过程. 黑色竖线为辅助线, 竖线右侧为未完全收集的部分

Figure 4. Scattering angle distributions for single and double electron capture in the collision process of Ar²⁺-N₂ at 40 keV energy: (a) The single electron capture process; (b) the double electron capture process. The black vertical lines are auxiliary lines, and the region to the right of the vertical lines indicates the incompletely collected portion.

DownLoad: Full-Size Img PowerPoint

图 5 在40 keV能量下, Ar²⁺-N₂碰撞过程不同散射角范围内双电子俘获的Q值谱, 其中过程 I: Ar²⁺(3s²3p⁴ ³P, ¹D, ¹S)+N₂→Ar(¹S)+$ \text{N}_{2}^{2+} $和过程II: Ar²⁺(3s²3p⁴ ³P, ¹D, ¹S)+N₂→Ar(3s²3p⁵nl )+$ \text{N}_{2}^{2+} $

Figure 5. Spectrum of Q values for double electron capture in the range of different scattering angles for the Ar²⁺-N₂ collision process at 40 keV energy, where Process I: Ar²⁺(3s²3p⁴ ³P, ¹D, ¹S)+N₂→Ar(¹S)+$ \text{N}_{2}^{2+} $and Process II: Ar²⁺(3s²3p⁴ ³P, ¹D, ¹S)+N₂→Ar(3s²3p⁵nl )+$ \text{N}_{2}^{2+} $.

DownLoad: Full-Size Img PowerPoint

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[2]	Isler R 1994 Plasma Phys. Control. Fusion 36 171 Google Scholar
[3]	Team D 2010 Plasma Sci. Technol. 12 11 Google Scholar
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[12]	Suk H, Guilbaud A, Hird B 1977 Can. J. Phys. 55 1594 Google Scholar
[13]	Rapp D, Francis W E 1962 J. Chem. Phys. 37 2631 Google Scholar
[14]	Huber B 1980 J. Phys. B: At. Mol. Phys. 13 809 Google Scholar
[15]	Shields G C, Moran T 1983 J. Phys. B: At. Mol. Phys. 16 3591 Google Scholar
[16]	Ma P F, Wang J R, Zhang Z X, Meng T M, Xia Z H, Ren B H, Wei L, Yao K, Xiao J, Zou Y M, Tu B S, Wei B R 2023 Nucl. Sci. Tech. 34 156 Google Scholar
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[18]	Dörner R, Mergel V, Jagutzki O, Spielberger L, Ullrich J, Moshammer R, Schmidt-Böcking H 2000 Phys. Rep. 330 95 Google Scholar
[19]	Ullrich J, Moshammer R, Dorn A, Dörner R, Schmidt L P H, Schmidt-Böcking H 2003 Rep. Prog. Phys. 66 1463 Google Scholar
[20]	Ryufuku H, Sasaki K, Watanabe T 1980 Phys. Rev. A 21 745 Google Scholar
[21]	Niehaus A 1986 J. Phys. B: At. Mol. Phys. 19 2925 Google Scholar
[22]	Cornelius K, Wojtkowski K, Olson R E 2000 J. Phys. B: At. Mol. Opt. Phys. 33 2017 Google Scholar
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[32]	Zhu X L, Cui S C, Xing D D, Xu J W, Najjari B, Zhao D M, Guo D L, Gao Y, Zhang R T, Su M G, Zhang S F, Ma X W 2024 Chin. Phys. B 33 023401 Google Scholar
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[41]	Chen Y H, Johnson R E, Humphris R R, Siegel M W, Boring J W 1975 J. Phys. B: At. Mol. Phys. 8 1527 Google Scholar

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State-resolved electron capture in low-energy Ar²⁺-Ar/N₂ collisions

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Corresponding author: ZHU Xiaolong, zhuxiaolong@impcas.ac.cn ; DONG Chenzhong, dongcz@nwnu.edu.cn ;

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State-resolved electron capture in low-energy Ar2+-Ar/N2 collisions

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Corresponding author: ZHU Xiaolong, zhuxiaolong@impcas.ac.cn ; DONG Chenzhong, dongcz@nwnu.edu.cn ;

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State-resolved electron capture in low-energy Ar²⁺-Ar/N₂ collisions